MunEDA Webinars



Title:
SRAM - 6sigma yield analysis and optimization with WiCkeD

Audience:
Memories Designer & Design Manager

Date / Time / Timezone:
2010-12-07 / 08:00:00 / BST/GMT
2010-12-07 / 09:00:00 / CEST/CET

Duration:
01:00:00

Description:
SRAM Static RAM cells are very sensitive against global variations and mismatch and therefore require powerful analysis and optimization tools to bring the yield and robustness to very high levels e.g. 6 sigma and beyond.

Learning Targets:
In this webinar you learn about how to analyse and optimize critical blocks like sense-amplifiers for SRAM cells to high yield and robustness levels with MunEDA WiCkeD tools.

Speaker:

Dr. Michael Pronath
MunEDA GmbH
Moderator: