MunEDA Webinars


Title:
SRAM - 6sigma yield analysis and optimization with WiCkeD

Audience:
Memory Designers & Design Manager

Date / Time / Timezone:
2011-03-24 / 08:00:00 / BST/GMT
2011-03-24 / 09:00:00 / CEST/CET
2011-03-24 / 13:30:00 / IST
2011-03-24 / 16:00:00 / CNST
2011-03-24 / 17:00:00 / JST/KST

Duration:
01:00:00

Description:
Many building blocks of SRAM are very sensitive against global variations and mismatch and therefore require powerful analysis and optimization tools to bring the yield and robustness to very high levels like 6 sigma and beyond.

Learning Targets:
In this webinar you learn about how to analyse and optimize critical blocks like sense amplifiers for SRAM cells to high yield and robustness levels with MunEDA WiCkeD tools.

Speaker:

Dr. Michael Pronath
MunEDA GmbH
Moderator:

Andreas Ripp
MunEDA GmbH