MunEDA User Group Meeting
STMicroelectronics: AMS Design Flow and Standardization of Analog Design Intents
Session 2.2, P. Daglio, STMicroelectronics
STMicroelectronics: Reducing Mismatch Impact by means of Proper Biasing in Fully Differential CMOS Structures
Session 1.3, A. Capasso, STMicroelectronics
HYNIX: Strategy for reducing the optimization time with the best performance
Session 8.1, S. Lee, Hynix
ON Semiconductor: Methodologies for Matching Analysis for Industrial Applications with WiCkeDTM
Session 7.3, C. Bonaldi, ON Semiconductor
STMicroelectronics: Multi-Testbench Analysis and Optimization of an LNA for AM radio receiver in 65 nm CMOS technology with WiCkeDTM 6.3
Session 5.3, A. Capasso, STMicroelectronics
STMicroelectronics: Embedded Flash memory Vx Linear Regulator porting from 90nm to 55nm technology while improving regulation accuracy to solve yield weakness
Session 4.2, V. Alberghina, STMicroelectronics