MunEDA User Group Meeting
MunEDA Tutorial – Flip-Flop High-Sigma Robustness Verification and Sizing with WiCkeD
Session 7.1, C. Roma, MunEDA
MunEDA Tutorial – (New Tool) Circuit Migration with New GUI-Version SPT 2.0
Session 2.1, D. Plant, MunEDA
STMicroelectronics – MUGM 2017 Chair Opening Remarks – Pierluigi Daglio
Session 1.2, P. Daglio, STMicroelectronics
MunEDA – Speed-up of OCV Characterization of Standard Cell Libraries with WiCkeD
Session 6.2, M. Yakupov, MunEDA
STMicroelectronics – Performance enhancement of CMOS tuner cells without increasing the area
Session 6.1, A. Ciccazzo, STMicroelectronics
X-Fab – Rapid adoption of MUNEDA design flows using X-FAB’s AMS Reference Kit
Session 5.4, J. Doblaski, X-Fab
CEITEC S.A – Trade-off Analysis between Area and Yield/Robustness demonstrated on a Bandgap Circuit
Session 5.2, D. B. Karolak, Ceitec
STMicroelectronics – Design of the BandGap voltage reference in 40nm technology using WiCkeD features of Optimization and feasibility
Session 4.2, P. A. Coppa, STMicroelectronics
STMicroelectronics – Reliability-aware design with WiCkeD in FDSOI Technologies
Session 3.3, V. Huard, STMicroelectronics
SK Hynix – Fail-analysis practices with WiCkeD tool – Bandgap reference circuit in nonvolatile memory
Session 3.2, J. Kim, SKHynix
