LSI TEC: Performance & Yield Optimization of a Switched DC/DC Converter in X-FAB XH035 Technology
Session 4.1, G. Strube, MunEDA
MunEDA User Group Meeting
Infineon: A new method for calculating standard deviations and correlation coefficients in modeling
Session 3.2, K.-W. Pieper, Infineon
Anvo-Systems Dresden: WiCkeDTM for nvSRAM Multi Corner Optimization
Session 3.1, A. Scade, Anvo-Systems
X-FAB: Process Capabilities and Design Ecosystem of X-FAB Semiconductor Foundries
Session 2.1, O. Zinke, X-FAB
STMicroelectronics – Advanced WiCkeDTM usage: A methodology for process variations impact analysis on huge circuits taking advantages of Synopsys CustomSim XA
Session 1.4, P. Daglio, STMicroelectronics
Synopsys – MunEDA: Synopsys Custom and Analog Mixed-Signal Overview & MunEDA WiCkeDTM Integration
Session 1.3, U. Trautner, Synopsys
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