MunEDA – Speed-up of OCV Characterization of Standard Cell Libraries with WiCkeD
Session 6.2, M. Yakupov, MunEDA
MUGM 2015
STMicroelectronics – Performance enhancement of CMOS tuner cells without increasing the area
Session 6.1, A. Ciccazzo, STMicroelectronics
X-Fab – Rapid adoption of MUNEDA design flows using X-FAB’s AMS Reference Kit
Session 5.4, J. Doblaski, X-Fab
CEITEC S.A – Trade-off Analysis between Area and Yield/Robustness demonstrated on a Bandgap Circuit
Session 5.2, D. B. Karolak, Ceitec
STMicroelectronics – Design of the BandGap voltage reference in 40nm technology using WiCkeD features of Optimization and feasibility
Session 4.2, P. A. Coppa, STMicroelectronics
STMicroelectronics – Reliability-aware design with WiCkeD in FDSOI Technologies
Session 3.3, V. Huard, STMicroelectronics
SK Hynix – Fail-analysis practices with WiCkeD tool – Bandgap reference circuit in nonvolatile memory
Session 3.2, J. Kim, SKHynix
SMIC – Optimization for extreme low power dissipation of bandgap designs with WiCkeD
Session 2.3, J. Yang, SMIC
STMicroelectronics – MUGM 2015 Chair Opening Remarks & Keynote Speech – MUGM 10 Year Anniversary
Session 1.2, P. Daglio, STMicroelectronics