HYNIX: Strategy for reducing the optimization time with the best performance
Session 8.1, S. Lee, Hynix
MUGM 2010
ON Semiconductor: Methodologies for Matching Analysis for Industrial Applications with WiCkeDTM
Session 7.3, C. Bonaldi, ON Semiconductor
STMicroelectronics: Multi-Testbench Analysis and Optimization of an LNA for AM radio receiver in 65 nm CMOS technology with WiCkeDTM 6.3
Session 5.3, A. Capasso, STMicroelectronics
STMicroelectronics: Embedded Flash memory Vx Linear Regulator porting from 90nm to 55nm technology while improving regulation accuracy to solve yield weakness
Session 4.2, V. Alberghina, STMicroelectronics
LSI TEC: Performance & Yield Optimization of a Switched DC/DC Converter in X-FAB XH035 Technology
Session 4.1, G. Strube, MunEDA
Infineon: A new method for calculating standard deviations and correlation coefficients in modeling
Session 3.2, K.-W. Pieper, Infineon
Anvo-Systems Dresden: WiCkeDTM for nvSRAM Multi Corner Optimization
Session 3.1, A. Scade, Anvo-Systems
X-FAB: Process Capabilities and Design Ecosystem of X-FAB Semiconductor Foundries
Session 2.1, O. Zinke, X-FAB
STMicroelectronics – Advanced WiCkeDTM usage: A methodology for process variations impact analysis on huge circuits taking advantages of Synopsys CustomSim XA
Session 1.4, P. Daglio, STMicroelectronics
Synopsys – MunEDA: Synopsys Custom and Analog Mixed-Signal Overview & MunEDA WiCkeDTM Integration
Session 1.3, U. Trautner, Synopsys