Circuit Sizing & Tuning with WiCkeDTM
Meet performance specifications over all types of variation, design and operation parameters with MunEDA sizing & optimization tools RelOpt
Circuit Sizing & Tuning Tools for Circuit Performance, Low Power, Yield & Reliability
VarOpt
MunEDA WiCkeDTM NomOpt Tools for
Corner & Performance Circuit Sizing & Tuning
MunEDA WiCkeDTM NomOpt includes tools and solutions for sizing & tuning custom circuits regarding CORNER & PERFORMANCE based designs like constraints, performances, gain, frequency, slewrates, power, stability, area, and others.
Tools & Features - Corner & Performance Tuning
- Automated Sizing & Tuning for Custom Circuits in CMOS, FinFET, FDSOI, BiCMOS, Bipolar
- Topology Analysis and Diagnosis
- Constraint Management & Optimization
- Circuit Performance & Feasibility Optimization
- Gradient & Sensitivity based Circuit Optimization
- Global & Stochastic Circuit Optimization
- Discrete Circuit Optimization on grid structures for FinFET, FDSOI, Bipolar
- Specification driven Circuit Optimization
- Circuit Sizing & Tuning
Customer Benefits & Applications
- Fast & Powerful Sizing & Tuning Algorithms
- Make designer#s life easier and more comfortable
- Performance Optimization
- Corner Tuning & Verification
- Low Power Optimization
- Circuit Functionality & Feasibility Analysis
Tool Reference - Corner & Performance Tuning
Technical Support
- GUI Graphical User Interface
- SCR Programming & Scripting Interface (Batch)
- Supporting all major design and simulation environments for Custom IC Design
- Supporting most of major foundry PDK
MunEDA Support
Contact us for more information here
Customer References - Performance & Corner based Sizing & Tuning
MunEDA circuit sizing & tuning tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.
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STMicroelectronics - Sensitivity Analysis, Performance & Corner Optimization of DDRx High-Speed I/O in 28nm FDSOI Technology using WiCkeDTM NomOpt sizing & tuning tools (published @ MUGM 2011) -
Samsung - Batch Mode Sizing of 14nm FinFET General Purpose I/O & Memory Interface Macros with WiCkeDTM NomOpt sizing & tuning tools - Results: Up to 60% design time reduction, 6% better performance, 15% less area (published @ MUGM 2013)
NomOpt
Circuit Sizing & Tuning Tools for Circuit Performance, Low Power, Yield & Reliability
RelOpt
MunEDA WiCkeDTM VarOpt Tools for
Variation & Statistical Circuit Sizing & Tuning
MunEDA WiCkeDTM VarOpt includes tools and solutions for sizing & tuning custom circuits regarding VARIATION & STATISTICAL effect such as circuit sensitivities, Monte Carlo and Mismatch effects, Parametric Yield, and others.
Tools & Features - Variation & Statistical Circuit Sizing & Tuning
- Automated Sizing & Tuning for Custom Circuits in CMOS, FinFET, FDSOI, BiCMOS, Bipolar
- Constraint Management & Optimization
- Circuit Sizing & Tuning
- Yield Optimization for Low Sigma - 3sigma
- Yield Optimization for High Sigma - 6 sigma
- Yield Optimization for Ultra High Sigma - 9 sigma
- Circuit Performance & Feasibility Optimization
- Fast Gradient & Sensitivity based Circuit Optimization
Customer Benefits & Applications
- Silicon and Industry Proven since many years
- Fast & Powerful Sizing & Tuning Algorithms
- Make designer's life easier and more comfortable
- Robustness Optimization
- Variation & Yield Optimiziation
- Sigma Optimization
- Yield Trade off Analysis & Improvement
Tool Reference - Variation & Statistical Circuit Sizing & Tuning
Technical Support
- GUI Graphical User Interface
- SCR Programming & Scripting Interface (Batch)
- Supporting all major design and simulation environments for Custom IC Design
- Supporting most of major foundry PDK
MunEDA Support
Contact us for more information here
Customer References - Variation & Statistical based Circuit Sizing & Tuning
MunEDA statistical & variation analysis & verification tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.
VarOpt
Circuit Sizing & Tuning Tools for Circuit Performance, Low Power, Yield & Reliability
NomOpt
MunEDA WiCkeDTM RelOpt Tools for
Reliability & Aging based Circuit Sizing & Tuning
MunEDA WiCkeDTM RelOpt includes tools and solutions for sizing & tuning custom circuits regarding RELIABILITY & DEGRADATION including effects such as aging, stress, HCI, NBTI, PBTI, and others.
Tools & Features - Variation & Statistical Circuit Sizing & Tuning
- Secure chip reliability with accurate device sizing can be now extended across the overdrive designs approach
- Consider the main aging mechanisms HCI, BTI and TDDB during circuit sizing
- Optimize Performance @ Nominal + Worst Case Operating Conditions & Corners while keeping device stress within reliability margins
- Increase design quality minimizing the aging impact on IP area
- Automatic design flow to meet tight specifications, improving reliability margin with strongly reduced design time
Optimizing SRAM IP for Yield and Reliability
An IO Design Optimization Flow for Reliability in 28nm CMOS
Customer Benefits & Applications
- Silicon and Industry Proven since many years
- Fast & Powerful Sizing & Tuning Algorithms
- Make designer's life easier and more comfortable
- Reliability & Aging based Design
Tool Reference - Variation & Statistical Circuit Sizing & Tuning
Technical Support
- GUI Graphical User Interface
- SCR Programming & Scripting Interface (Batch)
- Supporting all major design and simulation environments for Custom IC Design
- Supporting most of major foundry PDK
MunEDA Support
Contact us for more information here
Customer References - Reliability & Aging based Circuit Sizing & Tuning
MunEDA statistical & variation analysis & verification tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.