muneda.com
Empowering Innovation
 
 
  • Solutions
    • Circuit Migration with SPT 2.0

      Circuit Schematic Migration & IP Porting

      Circuit Sizing for Low Power, Yield & Reliability

      Performance & Corner based Sizing & Tuning Variation, Sigma & Yield based Sizing & Tuning Reliability & Aging based Sizing & Tuning

      Variation Analysis, PVT, Monte Carlo & High-Sigma

      Circuit & Sensitivity Analysis PVT & Corner Analysis Monte Carlo Statistical Analysis 3-5 sigma High Sigma & Worst Case Analysis 6-9 sigma plus Robustness Verification Flow

      Application Cases

      High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation
  • Support
    • Publications & Technical Papers

      May 31st 2019
      Analog IP Migration and Verification - DAC 2019 Las Vegas Tutorial
      Apr 02nd 2018
      SemiWiki - Schematic porting – the key to analog design reuse
      Feb 28th 2018
      MOS-AK 2018 - Advances in Statistical Compact Modelling (MunEDA - Infineon)
      Nov 30th 2017
      SemiWiki - Using Sequential Testing to Shorten Monte Carlo Simulations
      May 31st 2017
      DAC 2017 MunEDA Booth Info Flyer
      See more...

      Webinars - On-demand

      VOD
      Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis
      VOD
      Webinar: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis (Japanese subtitles)
      VOD
      Analog IP Migration, Optimization and Verification (Japanese subtitles)
      VOD
      Analog IP Migration, Optimization and Verification
      See more...

      Webinars - Scheduled

      See more...

      E-Learning

      MunEDA E-Learning Platform Login (for existing MunEDA customers only)




      In case you are a MunEDA customer you can register for an E-Learning account.

      Otherwise please use our Information & Contact Request.
  • Community
    • Customers

      Selection of MunEDA Customers:
      Samsung LSI Altera SKHynix
      SMIC Toshiba Infineon
      See more...

      Partners and Associations

      Selection of MunEDA Partners:
      Synopsys Samsung Cadence
      TSMC GLOBALFOUNDRIES STMicroelectronics
      See more...

      MunEDA User Group Meetings

      Sep 24th 2019
      MUGM MunEDA User Group Meeting 2019 - Munich, Germany
      Nov 07th 2017
      MUGM MunEDA User Group Meeting 2017 - Munich, Germany
      Mar 03rd 2016
      MTF MunEDA Technical Forum Brazil 2016 - Trindade, Brazil
      Oct 27th 2015
      MUGM MunEDA User Group Meeting 2015 - Munich, Germany
      Apr 16th 2015
      MTF MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan
      See more...

      MunEDA University Program

      Selection of Members:
      Technical University of Munich Chair of Electronic Design Automation Chair of Technical Electronics
      Goethe University Frankfurt Institute of Microelectronic Systems Ulm - University of Applied Sciences
      See more...
  • Company
    • News

      Jul 31st 2019
      SemiWiki - 56th DAC – In Depth Look at Analog IP Migration from MunEDA
      Jul 17th 2019
      Visit GTI Forum Taiwan - MunEDA Presentation & Exhibition
      Jun 03rd 2019
      SemiWiki - Ceitec / MunEDA: A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation
      Feb 01st 2019
      See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe
      Jan 30th 2019
      IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA
      See more...

      Events

      Jun 30th 2020
      Webinar: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis - ,
      Jun 25th 2019
      IEEE NEWCAS 2019 - Munich, Germany
      Jun 03rd 2019
      DAC 2019 Tutorial - Las Vegas, USA
      May 08th 2019
      MunEDA Webinars May 8th - Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis - Americas, Europe, Asia, Timezones
      Oct 29th 2018
      Meet MunEDA @ Huada Empyrean User Group Meeting Oct 29, Nanjing, China - Nanjing, China
      See more...

      Company

      Information & Contact Request Contacts & Distributors About Us Management Advisory Board Directions Careers

      Corporate Headquarter

      MunEDA GmbH
      MunEDA GmbH
      Inselkammerstraße 5
      82008 Unterhaching, Germany

      fon: +49-89-622710-20
      fax: +49-89-622710-299
      email: info@muneda.com
      web: www.muneda.com
      map: Google-Maps
 
  • Solutions
    Circuit Migration | Sizing & Tuning | Analysis | Applications
  • Support
    Publications | Webinars | E-Learning | Info & Contact
  • Community
    Customers | Partners | MUGM | Universities
  • Company
    Distributors | About | Management | Advisory | Directions | Careers
 

Circuit Sizing & Tuning with WiCkeDTM

Meet performance specifications over all types of variation, design and operation parameters with MunEDA sizing & optimization tools
 RelOpt
Circuit Sizing & Tuning Tools for Circuit Performance, Low Power, Yield & Reliability
VarOpt 

MunEDA WiCkeDTM NomOpt Tools for
Corner & Performance Circuit Sizing & Tuning


MunEDA WiCkeDTM NomOpt includes tools and solutions for sizing & tuning custom circuits regarding CORNER & PERFORMANCE based designs like constraints, performances, gain, frequency, slewrates, power, stability, area, and others.


Download Datasheet here


Tools & Features - Corner & Performance Tuning


  • Automated Sizing & Tuning for Custom Circuits in CMOS, FinFET, FDSOI, BiCMOS, Bipolar
  • Topology Analysis and Diagnosis
  • Constraint Management & Optimization
  • Circuit Performance & Feasibility Optimization
  • Gradient & Sensitivity based Circuit Optimization
  • Global & Stochastic Circuit Optimization
  • Discrete Circuit Optimization on grid structures for FinFET, FDSOI, Bipolar
  • Specification driven Circuit Optimization
  • Circuit Sizing & Tuning

Design and Optimization of Analog IP is Possible
IC Design Optimization for Radiation Hardening


Customer Benefits & Applications


  • Fast & Powerful Sizing & Tuning Algorithms
  • Make designer#s life easier and more comfortable
  • Performance Optimization
  • Corner Tuning & Verification
  • Low Power Optimization
  • Circuit Functionality & Feasibility Analysis

Tool Reference - Corner & Performance Tuning



Technical Support


  • GUI Graphical User Interface
  • SCR Programming & Scripting Interface (Batch)
  • Supporting all major design and simulation environments for Custom IC Design
  • Supporting most of major foundry PDK

MunEDA Support


Contact us for more information here


Customer References - Performance & Corner based Sizing & Tuning


MunEDA circuit sizing & tuning tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.

  • STMicroelectronics - Sensitivity Analysis, Performance & Corner Optimization of DDRx High-Speed I/O in 28nm FDSOI Technology using WiCkeDTM NomOpt sizing & tuning tools (published @ MUGM 2011)
  • Samsung - Batch Mode Sizing of 14nm FinFET General Purpose I/O & Memory Interface Macros with WiCkeDTM NomOpt sizing & tuning tools - Results: Up to 60% design time reduction, 6% better performance, 15% less area (published @ MUGM 2013)
 NomOpt
Circuit Sizing & Tuning Tools for Circuit Performance, Low Power, Yield & Reliability
RelOpt 

MunEDA WiCkeDTM VarOpt Tools for
Variation & Statistical Circuit Sizing & Tuning


MunEDA WiCkeDTM VarOpt includes tools and solutions for sizing & tuning custom circuits regarding VARIATION & STATISTICAL effect such as circuit sensitivities, Monte Carlo and Mismatch effects, Parametric Yield, and others.


Download Datasheet here


Tools & Features - Variation & Statistical Circuit Sizing & Tuning


  • Automated Sizing & Tuning for Custom Circuits in CMOS, FinFET, FDSOI, BiCMOS, Bipolar
  • Constraint Management & Optimization
  • Circuit Sizing & Tuning
  • Yield Optimization for Low Sigma - 3sigma
  • Yield Optimization for High Sigma - 6 sigma
  • Yield Optimization for Ultra High Sigma - 9 sigma
  • Circuit Performance & Feasibility Optimization
  • Fast Gradient & Sensitivity based Circuit Optimization

Tuning Analog IP for High Yield at SMIC
WLAN Design Optimization at Lantiq


Customer Benefits & Applications


  • Silicon and Industry Proven since many years
  • Fast & Powerful Sizing & Tuning Algorithms
  • Make designer's life easier and more comfortable
  • Robustness Optimization
  • Variation & Yield Optimiziation
  • Sigma Optimization
  • Yield Trade off Analysis & Improvement

Tool Reference - Variation & Statistical Circuit Sizing & Tuning



Technical Support


  • GUI Graphical User Interface
  • SCR Programming & Scripting Interface (Batch)
  • Supporting all major design and simulation environments for Custom IC Design
  • Supporting most of major foundry PDK

MunEDA Support


Contact us for more information here


Customer References - Variation & Statistical based Circuit Sizing & Tuning


MunEDA statistical & variation analysis & verification tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.

  • SKHynix - Digital Full Custom Design - Path Delay Optimization in 28nm Receiver (1300 Transistors) for DRAM Memory -- 3-Step Yield Optimization of Delay of Pin-to-Pin-Skew with MunEDA WiCkeDTM VarOpt sizing & tuning tools (published @ MUGM 2011)
 VarOpt
Circuit Sizing & Tuning Tools for Circuit Performance, Low Power, Yield & Reliability
NomOpt 

MunEDA WiCkeDTM RelOpt Tools for
Reliability & Aging based Circuit Sizing & Tuning


MunEDA WiCkeDTM RelOpt includes tools and solutions for sizing & tuning custom circuits regarding RELIABILITY & DEGRADATION including effects such as aging, stress, HCI, NBTI, PBTI, and others.


Download Datasheet here


Tools & Features - Variation & Statistical Circuit Sizing & Tuning


  • Secure chip reliability with accurate device sizing can be now extended across the overdrive designs approach
  • Consider the main aging mechanisms HCI, BTI and TDDB during circuit sizing
  • Optimize Performance @ Nominal + Worst Case Operating Conditions & Corners while keeping device stress within reliability margins
  • Increase design quality minimizing the aging impact on IP area
  • Automatic design flow to meet tight specifications, improving reliability margin with strongly reduced design time

Optimizing SRAM IP for Yield and Reliability
An IO Design Optimization Flow for Reliability in 28nm CMOS


Customer Benefits & Applications


  • Silicon and Industry Proven since many years
  • Fast & Powerful Sizing & Tuning Algorithms
  • Make designer's life easier and more comfortable
  • Reliability & Aging based Design

Tool Reference - Variation & Statistical Circuit Sizing & Tuning



Technical Support


  • GUI Graphical User Interface
  • SCR Programming & Scripting Interface (Batch)
  • Supporting all major design and simulation environments for Custom IC Design
  • Supporting most of major foundry PDK

MunEDA Support


Contact us for more information here


Customer References - Reliability & Aging based Circuit Sizing & Tuning


MunEDA statistical & variation analysis & verification tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.

  • Infineon - Reliability & Yield Optimization of Relaxation Oscillator in Advanced CMOS Process Technology - Yield Improvement by 80% for fresh and 10 Year aged IC with MunEDA WiCkeDTM VarOpt sizing & tuning tools (published @ MUGM 2014)
 
 
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