Circuit Verification with WiCkeDTM
Analyze and verify your circuit designs for constraints, performance specifications, operating and process parameters, global and mismatch variation, reliability and othersCircuit Analysis & Verification with MunEDA WiCkeDTM
MunEDA provides with its comprehensive and powerful suite WiCkeDTM tools for simulation-based analysis and verification of Custom IC like circuit constraints, design parameters, PVT, operating corners, specifications, sensitivities, correlations, process dependencies, sweeps, global and mismatch variation, Monte-Carlo, Worst-Case, High Sigma, reliability and more.
Features of WiCkeDTM Circuit Verification tools including
- Parallel simulation environment (supporting industry-standard SPICE simulators)
- Multitestbench-Support
- Circuit Constraint Feasibility Check
- Circuit Sensitivity Analysis for performances, gain, frequency, slewrates, power, stability, area, others
- Fast PVT & Operating Corner Analysis: influence of corner cases on given circuit performances
- Parameter Screening
- Fast & Enhanced Monte Carlo Analysis (3-5 sigma plus)
- Importance Sampling & Robustness Verification
- High Sigma Worst Case Analysis (6-9 sigma plus)
- Global and local (mismatch) variation and yield analysis
- Reliability & aging analysis for degradation effects
- ... and many more
Learn more about the following MunEDA circuit analysis & verification tools & solutions here
Customer References - Circuit & Sensitivity Analysis & Debugging
MunEDA statistical & variation analysis & verification tools are successfully proven in thousands industrial circuit design projects with global semiconductor companies since many years.
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SMIC - Debugging & Verification of 40nm 10bit SAR ADC with MunEDA WiCkeD Variation Analysis tools - MunEDA PCM mapping flow to create global corners (published @ MUGM 2014) -
STMicroelectronics - Huge circuit statistical analysis with MunEDA WiCkeD variation analysis tools - Monte-Carlo analysis of High-Speed Clock Generator 65nm with 195k devices and Matrix of SenseAmps 90nm 210k devices (published @ MUGM 2010) -
Altera - FPGA CRAM cell analysis for 6,5 sigma with MunEDA WiCkeD variation analysis tools - Worst Case Analysis of Memory Cell in 40nm TSMC, cell repeated > 100M times on Stratix IV (published @ MUGM 2010) -
Infineon - SRAM Bitcell Analysis of 6T SRAM Bitcell in 65nm with MunEDA WiCkeD High Sigma Worst Case Analysis - verified 2 sigma global and 6 sigma local WCD (published @ MUGM 2006) -
ATMEL - Efficient Regression for Robustness Verification of Full-Custom Design Blocks - systematic check across combinations of worst-case scenarios (published @ DASS 2014)
