Publications & Technical Papers


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Apr
02nd
2018
SemiWiki - Schematic porting – the key to analog design reuse
SemiWiki
SemiWiki Blog April 02, 2018, April 2018, SemiWiki, USA
Feb
28th
2018
MOS-AK 2018 - Advances in Statistical Compact Modelling (MunEDA - Infineon)
Statistical Compact Modeling and use model
Method is available as GUI based MunEDA WiCkeD App “Statistical Fit”
Data normalization for fitting
Excluding mismatch effects by calculation from PCM measurements
Helpful input data consistency checks
Validation of results

February 2018, Munich , Germany
Nov
30th
2017
May
31st
2017
DAC 2017 MunEDA Booth Info Flyer
MunEDA
DAC 2017 MunEDA Booth Info Flyer, May 2017, Austin TX, USA
Sep
30th
2016
MunEDA White Paper - High sigma parametric yield estimation for SRAM and Standard Cells
MunEDA GmbH, Munich, Germany
September 2016, Munich, Germany
Aug
03rd
2016
Yield-driven Power-Delay-Optimal CMOS full-adder design PVT NBTI (Sapienza, MunEDA)
Sapienza University Rome - MunEDA
August 2016, Rome, Italy
Mar
31st
2016
IRPS 2016 - BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization - (STMicroelectronics-MunEDA)
STMicroelectronics - MunEDA
Reliability Physics Symposium (IRPS), 2016 IEEE International, March 2016, Monterey, USA
Aug
31st
2015
New Technology Migration Methodology for Analog IC Design (using MunEDA SPT Schematic Porting Tool)
NSCAD - UFRGS - MunEDA
SBCCI 2015, August 2015, Salvador, Brazil
Jul
31st
2015
Optimal NBTI Degradation and PVT Variation Resistant Device Sizing in a Full Adder Cell
Sapienza University Rome, Italy
MunEDA, Munich, Germany

ICRITO 2015, July 2015, Noida, India
Aug
31st
2014
Self-biased CMOS current reference based on the ZTC operation condition (using WiCkeD)
NSCAD - PGMICRO-UFRGS
SBCCI 2014, August 2014, Porto Alegre, Brazil