Publications & Technical Papers


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Oct
31st
2008
HONEY – Highly Optimized Design Methods for Yield and Reliability 2A713
STMicroelectronics - Infineon - X-FAB - MunEDA - IMMS
EUROPEAN NANOELECTRONICS Forum 2008, October 2008, Paris, France
Aug
31st
2008
Verification of Safe Operating Area (SOA) Constraints in Analog Circuits
X-FAB - ZMD - MunEDA
ZuE 2008 - Reliability and Design, August 2008, Ingolstadt, Germany
Aug
31st
2008
Verification of Safe Operating Area (SOA) Constraints in Analog Circuits
ZMD AG, Dresden, Germany
X-Fab Semiconductor Foundries AG, Erfurt, Germany
MunEDA GmbH, Munich, Germany

ZuE 2008 - Reliability and Design, August 2008, Ingolstadt, Germany
Apr
30th
2008
Technology Setup for WiCkeD in X-FAB CMOS and BiCMOS Processes for Automotive and Sensor Applications
X-FAB - IMMS - MunEDA
edaWorkshop 2008, April 2008, Hannover, Germany
Apr
30th
2008
Analysis and Optimization of a CMOS Mixer Circuit with WiCkeD
Fraunhofer - MunEDA
edaWorkshop 2008, April 2008, Hannover, Germany
Feb
29th
2008
VeronA - Verification of Analog Circuits - BMBF Project 01 M 3079 edacentrum
Atmel, Bosch, Cadence, Infineon, MunEDA, Qimonda
DATE08, February 2008, Munich, Germany
Feb
29th
2008
Robust Analog Design for Automotive Aplications by Design Centering with Safe Operating Areas
ZMD AG, Dresden, Germany
MunEDA GmbH, Munich, Germany

ISQED´08, February 2008, San Jose, CA, USA