Publications & Technical Papers


All | Latest | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1996 | 1994 | 1991

Aug
31st
2006
Yield Optimisation of Power-On Reset Cells and Functional Verification - Power-on Reset Cell (POR) in 350nm CMOS Technology
austriamicrosystems AG, Unterpremstaetten, Austria
MunEDA GmbH, Munich, Germany

ANALOG06, August 2006, Dresden, Germany
Aug
31st
2006
Experimental Verification of Simulation Based Yield Optimization for Power-On Reset Cells
austriamicrosystems AG, Unterpremstaetten, Austria
MunEDA GmbH, Munich, Germany

CICC 2006, August 2006, San Jose, CA, USA
Aug
31st
2006
Modelling of the parametric yield in decananometer SRAM-Arrays - Sense-Amplifier for SRAM-Memory in 90nm and 65nm CMOS Technology
Infineon Technologies, Munich, Germany
Advances in Radio Science 2006, August 2006, Katlenburg-Lindau, Germany
Aug
31st
2006
6T for Embedded SRAM - six sigma design with WiCkeD
Infineon Technologies, Munich, Germany
MUGM 2006, August 2006, Munich, Germany
Jun
30th
2006
Analysis and Optimization of Mismatch in Analog Designs with WiCkeD
STMicroelectronics
June 2006, Agrate, Italy
Jun
30th
2006
Apr
30th
2006
Design for Yield Concepts for Analogue and Mixed-Signal Circuits
MunEDA GmbH, Munich, Germany
MEDEA-DAC 2006, April 2006, Prien, Germany
Apr
30th
2006
ANASTASIA+ - Successful bridge from basic methodology research to industrial design tool delivery
MunEDA GmbH, Munich, Germany
MEDEA-DAC 2006, April 2006, Prien, Germany
Feb
28th
2006
DATE 2006 Special Session: DFM/DFY Design for Manufacturability and Yield - influence of process variations in digital, analog and mixed-signal circuit design
MunEDA GmbH, Munich, Germany
IBM Deutschland Entwicklung GmbH, Böblingen, Germany
IBM Inc., Burlington, USA
Technical University Munich, Germany
Infineon Technologies AG, Munich, Germany

DATE06, February 2006, Munich, Germany