Publications & Technical Papers


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Oct
31st
2001
On Parametric Test Design for Analog Integrated Circuits considering Error in Measurement and Stimulus
Technical University Munich, Germany
Modeling, Simulation and Optimization of Integrated Circuits 2001, October 2001, Oberwolfach, Germany
Oct
31st
2001
The sizing rules method for analog integrated circuit design
Infineon Technologies, Munich, Germany
Technical University of Munich, Germany

ICCAD 2001, October 2001, San Jose, CA, USA
May
31st
2001
Mismatch Analysis and Direct Yield Optimization by Spec-Wise Linearization and Feasibility-Guided Search
Technical University Munich, Germany
DAC 2001, May 2001, Las Vegas, NV, USA
May
31st
2001
Estimation of the Influence of Test Stimulus Precision on Test Quality for Parametric Faults in Analog Integrated Circuits
Technical University Munich, Germany
IEEE Mixed Signal Test Workshop 2001, May 2001, Atlanta, GA, USA
Apr
30th
2001
A Fast Method for Identifying Matching-Relevant Transistor Pairs
Technical University Munich, Germany
CICC 2001, April 2001, San Diego, CA,USA