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ZMD, X-Fab & MunEDA will present paper and session at SCD09 Semiconductor Conference Dresden 29/30 April 2009


Dresden, Germany - Friday, April 03rd, 2009

ZMD, X-Fab & MunEDA will present a common paper and session at this year SCD Semiconductor Conference Dresden (www.gerotron.com/html/messen/scd_drei.htm). The paper and session will be presented by Udo Sobe, Karl-Heinz Rooch, Dietmar Mörtl and Achim Graupner from ZMD AG, Dresden, Andre Lerch from X-FAB Semiconductor Foundries AG, Erfurt and Michael Pronath from MunEDA GmbH, München.

The paper and session covers the topic Verification Method for Analog and Mixed Circuits Considering Performance Parameters and Safe Operating Area (SOA) Constraints. This publication will cover important results in research of influences of operating conditions on circuit robustness and reliability in front-end circuit design.

The SCD09 is an leading international Conference, Workshop and Table-top Exhibition for Chip, Packaging, Design, Simulation and Test and will take place at 2009 April 29/30 in the Kulturpalast Dresden.



About MunEDA
MunEDA develops and licenses EDA tools and solutions that analyze, model, optimize and verify the performance, robustness and yield of analog, mixed-signal and digital circuits. Leading semiconductor companies rely on MunEDA's WiCkeD' tool suite - the industry's most comprehensive range of advanced circuit analysis solutions - to reduce circuit design time and achieve maximum yield in their communications, computer, memory, automotive and consumer electronics designs. Founded in 2001, MunEDA is headquartered in Munich, Germany, with offices in Sunnyvale, California, USA (MunEDA Inc.), and leading EDA distributors in the U.S., Japan, Korea, Taiwan, Singapore, Malaysia, Scandinavia, and other countries worldwide. For more information, please visit MunEDA at www.muneda.com/contacts.php.