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ZMD and MunEDA awarded for Best Paper Award 2007 at ZuE Conference 2008 in Ingolstadt

Ingolstadt, Germany - Friday, September 19th, 2008

ZMD and MunEDA have received the Best Paper Award from ZuE Zuverlässigkeit und Entwurf (Reliability & Design) Conference for their paper contribution at ZuE 2007 that was selected by the committee for the best paper award. The contribution is about "Robust Analog Design for Automotive Applications by Design Centering". Authors are Karl-Heinz Rooch and Dr. Udo Sobe from ZMD AG, Dresden, Germany as well as Dr. Michael Pronath from MunEDA GmbH, Munich Germany.

The award was supplemented to the winners in a ceremony at ZuE2008 in Ingolstadt by the ZuE committee Dr. Sebastian Sattler and Prof. Dr. Hans-Joachim Wunderlich.

MunEDA is also co-sponsor of the ZuE2008 in Ingolstadt.

About MunEDA
MunEDA develops and licenses EDA tools and solutions that analyze, model, optimize and verify the performance, robustness and yield of analog, mixed-signal and digital circuits. Leading semiconductor companies rely on MunEDA's WiCkeD' tool suite - the industry's most comprehensive range of advanced circuit analysis solutions - to reduce circuit design time and achieve maximum yield in their communications, computer, memory, automotive and consumer electronics designs. Founded in 2001, MunEDA is headquartered in Munich, Germany, with offices in Cupertino, California, USA (MunEDA Inc.), and leading EDA distributors in the U.S., Japan, Korea, Taiwan, Singapore, Malaysia, Scandinavia, and other countries worldwide. For more information, please visit MunEDA at