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MunEDA official sponsor of the VDE Conference Reliability and Design (ZuD) in Munich


Munich, Germany - Tuesday, February 06th, 2007

The conference focuses on the challenges of integrated circuit design especially based on reli-ability aspects. Todays systems with more than hundreds of millions of transistors consist of various digital and analog components manufactured with different process technologies. Embedded systems, One-Chip-Systems, Multiprocessors and Networks-on-a-Chip often go by far beyond a pure control and operation of devices and machineries, vehicles and traffic control systems. These systems have huge requirements in stability and reliability. But with further technology shrinks into nano technologies the elementary components like transistors and wires will vary over a large parameter space. System architecture that depend on error free functionality of all components makes it very hard to be manufactured with economically meaningful yield figures. The conference therefore presents innovative methodologies to fulfil yield and reliability of micro- and nano-electronical systems based on error tolerance and in-tegrated repair mechanisms also in the future. These methodologies have to compensate manufacturing faults, parameter fluctuation as well as other disturbance during the operation of such systems over the whole product life cycle.

Chairman of the VDE Conference Reliability and Design is Dr. Sebastian Sattler from In-fineon Technologies AG, Neubiberg. Prof. Dr. Hans-Joachim Wunderlich from University of Stuttgart serves as President of the Program Committee.

Andreas Ripp, MunEDA Vice President Sales & Marketing, also serving as member of the program committee of the VDE Conference Reliability and Design: "We are looking forward to the VDE Conference Reliability and Design and are glad that MunEDA together with our official co-sponsors can support this excellent conference that will take place in Munich. We want the conference - which takes place first time - to be estab-lished and recommended for this specific topic reliability and design within a national and international audience."

MunEDA together with ZMD-ZFoundry (www.zmd.de) additionally will contribute the common talk and technical paper "Robust Analog Design for Automotive Applications by Design Centering" on the conference. Speakers are Dr. Udo Sobe and Karl-Heinz Rooch from ZMD-ZFoundry as well as Dr. Michael Pronath, Vice President Products & Solutions from MunEDA. Other speakers on the conference coming from companies like Infineon, Atmel, X-Fab, Bosch, IBM, ARM, Intel, AMD, Cadence, Qimonda, Fraunhofer, Nokia, as well as nu-merous universities and research institutes.

Find more information about the VDE Conference Reliability and Design (ZuD) at: www.vde.com/Conferences_en/ZuD.

About MunEDA
MunEDA develops and licenses EDA tools and solutions that analyze, model, optimize and verify the performance, robustness and yield of analog, mixed-signal and digital circuits. Leading semiconductor companies rely on MunEDA's WiCkeD' tool suite - the industry's most comprehensive range of advanced circuit analysis solutions - to reduce circuit design time and achieve maximum yield in their communications, computer, memory, automotive and consumer electronics designs. Founded in 2001, MunEDA is headquartered in Munich, Germany, with offices in Sunnyvale, California, USA (MunEDA Inc.), and leading EDA distributors in the U.S., Japan, Korea, Taiwan, Singapore, Malaysia, Scandinavia, and other countries worldwide. For more information, please visit MunEDA at www.muneda.com/contacts.php.