MunEDA News

All | Latest | 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2000

CICC & ANALOG 2006: Technical contributions regarding WiCkeDTM

Munich, Germany - Friday, September 29th, 2006

MunEDA together with customers austriamicrosystems and ZMD-ZFoundry presented technical papers and posters at CICC2006 in San Jose and ANALOG2006 in Dresden.

At Custom Integrated Circuit Conference (CICC) 2006 September 13th, 2006, in San Jose Dr. Gerhard Rappitsch and Dipl.-Ing. Oliver Eisenberger from austriamicrosystems together with Dr. Michael Pronath, Dr. Bernd Obermeier and Dipl.-Ing. Andreas Ripp from MunEDA presented in Session 29 - Modelling and EDA Challenges in Nano-CMOS the contribution "Experimental Verification of Simulation Based Yield Optimization for Power-On Reset Cells". Within this talk austriamicrosystems and MunEDA presented the new austriamicrosystems Design for Manufacturability (DFM) reference design flow using WiCkeD. Furthermore different analysis and sizing steps to optimize a Power-on reset (POR) cell with WiCkeD within austriamicrosystems process design environment HIP-Kit were presented. The optimised results on improved production yield were verified in silicon. Parts of the results of this circuit optimization projects were also presented in a poster session at ANALOG2006 in Dresden.

At ANALOG2006 conference in Dresden Dr. Udo Sobe and Dipl.-Ing. Karl-Heinz Rooch from ZMD-ZFoundry together with Dr. Michael Pronath from MunEDA presented a technical paper about "Circuit Design-for-Yield for a 110 dB Op-Amp for Automotive and Sensor Applications with WiCkeD". In this project WiCkeD was utilized in a very complex hierarchical design. Within the design especially the trade off between high DC-gain and settling time was a large challenge. Within a WiCkeD and ZMD-Inhouse-tool ZMD-Analyser five step-flow (A-Feasibility of Main Topology, B-Optimization of the SBC sub-blocks, C-Optimization of main circuit, D-Yield Analysis and optimization, E-Final centering, rounding and verification) there could be achieved a yield level of > 98% from starting low level usual for a new developed design.

Download Technical Paper

About MunEDA
MunEDA develops and licenses EDA tools and solutions that analyze, model, optimize and verify the performance, robustness and yield of analog, mixed-signal and digital circuits. Leading semiconductor companies rely on MunEDA's WiCkeD' tool suite - the industry's most comprehensive range of advanced circuit analysis solutions - to reduce circuit design time and achieve maximum yield in their communications, computer, memory, automotive and consumer electronics designs. Founded in 2001, MunEDA is headquartered in Munich, Germany, with offices in Cupertino, California, USA (MunEDA Inc.), and leading EDA distributors in the U.S., Japan, Korea, Taiwan, Singapore, Malaysia, Scandinavia, and other countries worldwide. For more information, please visit MunEDA at