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DATE06: DFM-DFY Special Session by IBM, Infineon, TUM and MunEDA

Munich, Germany - Wednesday, March 08th, 2006

IBM, Infineon, TUM and MunEDA presented Special Session DFM/DFY Design for Manufacturability and Yield at DATE 2006 in Munich at March 08, 2006 - influence of process variations and increased defect sensitivity in digital, analog and mixed-signal circuit design. The session was organized and moderated by Dr. Markus Bühler, IBM Deutschland Entwicklung GmbH, Germany and Andreas Ripp, MunEDA GmbH, Germany.

Speakers and Talks of the Session have been:

The special session was covering new methodologies and their industrial applications for Design for Manufacturability and Yield DFM/DFY. These innovative methodologies are bringing together domains that co-existed mostly separated until now - circuit design, physical design and manufacturing process. The session therefore presents seamless DFM/DFY concepts realized for the design of digital, analog, and mixed-signal circuits.

About MunEDA
MunEDA develops and licenses EDA tools and solutions that analyze, model, optimize and verify the performance, robustness and yield of analog, mixed-signal and digital circuits. Leading semiconductor companies rely on MunEDA's WiCkeD' tool suite - the industry's most comprehensive range of advanced circuit analysis solutions - to reduce circuit design time and achieve maximum yield in their communications, computer, memory, automotive and consumer electronics designs. Founded in 2001, MunEDA is headquartered in Munich, Germany, with offices in Cupertino, California, USA (MunEDA Inc.), and leading EDA distributors in the U.S., Japan, Korea, Taiwan, Singapore, Malaysia, Scandinavia, and other countries worldwide. For more information, please visit MunEDA at