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MUGM 2012

Overview

We are pleased to invite you to the MunEDA Users Group Meeting 2012.

MUGM 2012 will take place on October 18th & 19th (Thu/Fri), 2012 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2012 will be the special topic:

High-sigma analysis and design optimization in deep-submicron technologies (65nm, 40nm, 28nm, 20nm and below)

Date:
October 18 – 10:30 a.m. to 06:00 p.m.
October 19 – 09:00 a.m. to 06:00 p.m.

Location:
Novotel Munich City
Hochstrasse 11
81669 Munich, Germany

Selection of Presentation Topics at MUGM 2012:

  • SPT Schematic Porting
  • Handling Design Contraints & Sizing Rules
  • IP Porting & Technology Migration
  • Design Performance & Specification Analysis
  • Response Surface Modelling & Model Generation
  • Circuit Design Optimization & Verification
  • Statistical Circuit Analysis & Optimization
  • Multi-Testbench Environment & Corner-Based Optimization
  • Worst-Case Distance Analysis & Optimization
  • Design Shrink & Nano-scale Circuit optimization
  • Industrial Design Cases
Program

Thursday, 18th October, 2012

09:30 – 10:30Registration & Welcome Coffee
10:30 – 12:45Session 1: Keynotes & What’s new
10:30 – 10:45MunEDA – Welcome & Whats new
A. Ripp, VP Sales & Marketing, MunEDA
10:45 – 11:30What´s new in WiCkeD 6.5 – Integrations & R&D Roadmap
F. Schenkel, VP Research & Development, MunEDA
11:30 – 12:00Agilent GoldenGate RFIC Simulation and Analysis Software and Interoperability with MunEDA WiCkeD
I. Nickeleit, C. Pujol, Agilent EESof EDA
12:00 – 12:30GLOBALFOUNDRIES – The Company, Technologies and Design Enablement
R. Meyer, GLOBALFOUNDRIES
12:30 – 12:45Low Power MPSoC Circuit Design in GLOBALFOUNDRIES 28nm CMOS with WiCkeD
S. Höppner, Technical University Dresden
12:45 – 14:00MUGM Group Picture & Lunch Break
14:00 – 15:45Session 2: Process Corners in WiCkeD
14:00 – 14:30New WiCkeD Features: Corner Handling in WiCkeD 6.5
M. Pronath, VP Products & Solutions, MunEDA
14:30 – 14:55Corner parameter generation with WiCkeD
E. Gondro, K.-W. Pieper, Infineon
14:55 – 15:20WiCkeD + CustomSim-XA for Fast Monte Carlo & WiCkeD + Cadence for Design Intent Capturing
E. Raciti, STMicroelectronics
15:20 – 15:45Sizing of FPGA cells with combination of WiCkeD and Least Squares Fitting
J. Lin, Altera
15:45 – 16:15Coffee Break – Demos & Exhibition
16:15 – 18:00Session 3: SPT & IP Porting
16:15 – 16:45SPT Schematic Porting Tool – Update and Application Examples
M. Yakupov, MunEDA
16:45 – 17:15Introduction Evatronix IP Cores and Services & Low/Fast Speed Differential OpAmp in 40nm TSMC with WiCkeD
C. Elgert, D. Pienkowski, J. Kopanski, Evatronix
17:15 – 17:45Circuit Porting and Re-Sizing in STARCAD-AMS Flow
Y. Sasaki, STARC
17:45 – 18:00Introduction New MunEDA E-Learning Platform
B. Kahl-Grasenack, MunEDA
18:00- 18:05Wrap-up Day 1 and Directions
A. Ripp, VP Sales & Marketing, MunEDA
From 19:30Social Event at Welser Kuche

Friday, 19th October, 2012

09:00 – 10:20Session 4: FP7 & CATRENE Funding Projects
09:00 – 09:30FP7-Funding Projects THERMINATOR, SMAC, MANON Overview
G. Gangemi, STMicroelectronics
09:30 – 09:55WiCkeD results in the optimization of power aware current-mode devices and other prospective applications at Sapienza University of Rome
Z. Abbas, M. Olivieri, University of Rome
09:55 – 10:20Using Wicked in a Contract Research Environment
E. Herzer, Fraunhofer
10:20 – 11:00Coffee Break – Demos & Exhibition
11:00 – 12:30Session 5: Memory Design Techniques
11:00 – 11:30MunEDA Tutorial – SRAM & Memory Design- high-sigma yield analysis and optimization with WiCkeD
C. Roma, MunEDA
11:30 – 12:00Using Wicked for SRAM sense amp optimization
M. Derevlean, L.-F. Mariut, Microsemi
12:00 – 12:30FPGA Routing Driver Optimization
G. H. Oh, Altera
12:30 – 14:00Lunch Break
14:00 – 15:30Session 6: Standard Cell & High-Speed I/O
14:00 – 14:30Automated Numerical Resizing of Standard Cells in WiCkeD
P. Tavares, MunEDA
14:30 – 15:00Sizing of standard cells in worst-case process conditions in 110nm BCD9s
F. Adduci, A. Capasso, A. Colaci, A. Roggero, STMicroelectronics
15:00 – 15:30Design Centering of IO in 28nm FDSOI technology
H. Degoirat, STMicroelectronics
15:30 – 16:00Coffee Break – Demos & Exhibition
16:00 – 17:30Session 7: Special Topics
16:00 – 16:30Verification and Optimization of Digital Radio Receiver Sub Circuits
A. Bänisch, T. Ußmüller, B. Brütting, University Erlangen
16:30 – 17:00Educational Program for Brazilian IC Design Industry
A. Schmidt, NSCAD
17:00 – 17:30Automated, Analog Synthesis-driven Process Technology Exploration with WiCkeD
M. Meissner, L. Hedrich, University Frankfurt am Main
17:30 – 17:45Wrap-up & Farewell
Social Event

Welser Kuche

Address

Feldherrnkeller
Residenzstraße 27
80333 Munich

fon: +49 89 / 29 65 65
directions: Google Maps

Proceedings

Here you will find the password protected MUGM 2012 proceedings:

https://www.muneda.com/mugm/mugm-2012/proceedings/

To view the password protected MUGM Proceedings, send us a request

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