MunEDA User Group Meetings


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MunEDA User Group Meeting Europe 2015, Oct 27th / Oct 28th - Presentations


 
STMicroelectronics - MUGM 2015 Chair Opening Remarks & Keynote Speech - MUGM 10 Year Anniversary
Presenter: P. Daglio
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MunEDA - What's new in WiCkeD 6.8 - Integration & R&D Roadmap
Presenter: F. Schenkel
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Empyrean - One-Stop Layout Analysis Platform - Skipper
Presenter: O. Wei
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MunEDA - WiCkeD 6.8 Tool Demo - Enhancements & New Features
Presenter: M. Sylvester
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Fraunhofer - Speedup performance calculation with SpectreMDL and external extractor script
Presenter: E. Herzer
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SMIC - Optimization for extreme low power dissipation of bandgap designs with WiCkeD
Presenter: Z. Deng / J. Yang / SMIC / O. Wei / Empyrean
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MunEDA - Hierarchical SRAM worst-case analysis (Tutorial)
Presenter: M. Yakupov
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MunEDA - MunEDA R&D Updates - Flexible goals for yield optimization
Presenter: D. Pronath
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SK Hynix - Fail-analysis practices with WiCkeD tool - Bandgap reference circuit in nonvolatile memory
Presenter: J. Kim
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STMicroelectronics - Reliability-aware design with WiCkeD in FDSOI Technologies
Presenter: V. Huard
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MunEDA - Multi stage worst-case analysis
Presenter: D. Plant
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University Jena - Optimization of Settling Time and Stability for a Low-power Fully-differential Operational Amplifier with WiCkeD
Presenter: D. Schreiber
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STMicroelectronics - Design of the BandGap voltage reference in 40nm technology using WiCkeD features of Optimization and feasibility
Presenter: P. A. Coppa
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MunEDA - Parameter Screening methods in WiCkeD 6.8 (Tutorial)
Presenter: V. Glöckel
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University Rome - Optimal NBTI Degradation and PVT Variation Resistant Device Sizing in a Full Adder Cell
Presenter: U. Khalid / Z. Abbas
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MunEDA - Update to the Brasilian Semiconductor Ecosystem
Presenter: G. Strube
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CEITEC - Trade-off Analysis between Area and Yield/Robustness demonstrated on a Bandgap Circuit
Presenter: D. B. Karolak
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Institute for Advanced Studies - Circuit Design Optimization with WiCkeD for Radiation Hardening
Presenter: P. Agostino
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X-Fab - Rapid adoption of MUNEDA design flows using X-FAB's AMS Reference Kit
Presenter: J. Doblaski
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STMicroelectronics - Performance enhancement of CMOS tuner cells without increasing the area
Presenter: A. Ciccazzo / A. Capasso
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MunEDA - Speed-up of OCV Characterization of Standard Cell Libraries with WiCkeD
Presenter: M. Yakupov
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