Overview
We are pleased to invite you to the MunEDA Users Group Meeting 2017.
MUGM 2017 will take place on November 7th & 8th (Tue/Wed), 2017 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
Date:
November 7 – 09:30 a.m. to 06:00 p.m.
November 8 – 09:30 a.m. to 05:30 p.m.
Location:
Le Méridien
Bayerstraße 41
80335 Munich, Germany
Program
Tuesday, 7th November, 2017
| 09:30 – 10:30 | Registration & Welcome Coffee |
| 10:30 – 12:00 | Session 1: Opening & What’s new |
| MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA | |
| STMicroelectronics – MUGM 2017 Chair Opening Remarks – Pierluigi Daglio P. Daglio, STMicroelectronics – MUGM 2017 Conference Chair | |
| MunEDA – What’s new in WiCkeD 7.1 – Integration & R&D Roadmap F. Schenkel, VP Research & Development, MunEDA | |
| Empyrean / ICScape – Verification for Silicon Success J. Xing, Empyrean KC Chen, ICScape | |
| MUGM Group Picture All Participants | |
| 12:00 – 13:30 | Lunch Break |
| 13:30 – 15:30 | Session 2: Circuit Migration & Design Retargeting |
| MunEDA Tutorial – (New Tool) Circuit Migration with New GUI-Version SPT 2.0 D. Plant, MunEDA | |
| SMIC – Usage of WiCkeD in SMIC’s Flash Aplications YJ Kwon, SMIC | |
| STMicroelectronics – Design optimization and Retargeting Strategies of Standard Cells with WiCkeD in 28nm FDSOI Technology N. Ben Salem, STMicroelectronics | |
| X-FAB – Technology Offering & WiCkeD in X-FAB’s AMS Reference Kit M. Wilhelm, X-FAB | |
| 15:30 – 16:15 | Coffee Break – Demos & Exhibition |
| 16:15 – 18:00 | Session 3: (Ultra-)High-Sigma & Yield Analysis and Optimization |
| MunEDA Tutorial – Worst Case Analysis Methodology with WiCkeD M. Pronath, MunEDA | |
| Infineon – High Sigma Verification of SRAM cells P. Huber, Infineon S. Schumann, Infineon W. Kamp, Infineon P. Micus, Infineon | |
| MunEDA Tutorial – Monte Carlo Yield Validation – Speed-up using Sequential Testing – New BigMC Tool V. Glöckel, MunEDA | |
| From 19:30 | “MunEDA Novemberfest” – Social Event at Donisl |
Wednesday, 8th November, 2017
| 09:30 – 10:30 | Session 4: Reliability in Circuit & System Level Design |
| MunEDA Tutorial – (New Tool) Yield Plot – Contour Line Plots of Parametric Yield and PCM performances M. Sylvester, MunEDA | |
| Infineon – RESIST RESilient Integrated SysTems (EU CATRENE Project RESIST) K. Puscharsky, Infineon G. Georgakos, Infineon | |
| TUM – Munich Technical University – Power-Down Synthesis for Analog Circuits M. Neuner, Munich Technical University | |
| 10:30 – 11:00 | Coffee Break – Demos & Exhibition |
| 11:00 – 12:30 | Session 5: Low Power & Performance Optimization for Custom IC |
| MunEDA Tutorial – Low-Power Circuit Sizing for Custom IC D. Plant, MunEDA | |
| Robert Bosch – A Generic Topology Selection Method of Analog Circuits with Embedded Circuit Sizing Demonstrated on OTA Example A. Gerlach, Robert Bosch | |
| STMicroelectronics – Read Path Optimization for 40nm Technology P. Coppa, STMicroelectronics | |
| Novatek – Robustness Optimization of AMS & Standard Cell circuits in advanced technologies CP Huang, Novatek | |
| 12:30 – 14:00 | Lunch Break |
| 14:00 – 15:30 | Session 6: Statistical & Optical Modelling & Yield Analysis |
| MunEDA Tutorial – SRAM Hierarchical Read Failure Analysis M. Pronath, MunEDA | |
| SKHynix – Fail analysis of Digital Temperature Sensors with WiCkeD in Non-Volatile Memory C. Seungwan, SKHynix S. Choi, SKHynix | |
| LinkGlobal21 – Optic Simulation Solutions in High End Devices J. Park, LinkGlobal21 D. Kang, LinkGlobal21 | |
| TUM – Munich Technical University – Robustness Optimization for MEMS-IC Systems F. Burcea, Munich Technical University | |
| 15:30 – 16:00 | Coffee Break – Demos & Exhibition |
| 16:00 – 17:30 | Session 7: Robust and High-Perfomance Design |
| MunEDA Tutorial – Flip-Flop High-Sigma Robustness Verification and Sizing with WiCkeD C. Roma, MunEDA | |
| Jena University – Optimization of a Low-power Fully Differential OTA with WiCkeD and an Introduction to Modelling the Performance Space of Front-ends for Thermoelectric Sensor Arrays D. Schreiber, Jena University | |
| Chipus Microelectronics S.A. – Robustness verification for trimmed references M. Pesatti, Chipus Microelectronics | |
| CTI – Circuit Analysis and Optimization of Voltage Reference J.E.V. Solano, CTI | |
| 17:30 – 17:45 | Wrap-up & Farewell |
Social Event
Donisl
Proceedings
Here you will find the password protected MUGM 2017 proceedings:
https://www.muneda.com/mugm/mugm-2017/proceedings/