Analog Circuit Verification Methodology
Abstract:
MunEDA’s software package WiCkeD™ is a tool suite for circuit analysis, sizing, and modeling at transistor level.
White Papers
Analog Circuit Migration and Optimization from 28nm Bulk to 14nm FinFET Technology: A Case Study (SPT, WiCkeD)
Abstract:
Advanced process nodes utilize FinFET devices, for their improved performance and leakage power characteristics.
High sigma parametric yield estimation for SRAM and standard cells
Abstract:
Verification of SRAMand standard cells poses a specific challenge to the designer because the parametric yield estimation is to be estimated for very low failure rates below 1ppb (10 –9), equivalent to >6 sigma robustness.
Fast Monte Carlo Methods for Custom Circuit Analysis in MunEDA WiCkeD
Abstract:
Verification of custom circuit designs in sub-100nm technologies poses a specific challenge to the designer because simulation runtime can be long.
Innovative Design Methodology for Analog-to-Digital and Digital-to-Analog Converters
Abstract:
ADCs and DACs are vital in modern signal processing, connecting analog and digital domains. Growing demands make manual design a bottleneck; MeKoWA project aims to automate ADC and DAC design.