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Strategies for Initial Sizing and Operating Point Analysis of Analog Circuits

Authors

V. Boos, J. Nowak, S. Henker, S. Hoeppner, M. Sylvester, H. Grimm

Published in

DATE 2011 – Design Automation and Test in Europe Conference, March 2011, Grenoble, France

Link

https://ieeexplore.ieee.org/document/5763266