We are pleased to invite you to the MunEDA Users Group Meeting 2011.
MUGM 2011 will take place on November 24th & 25th (Thu/Fri), 2011 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
This years focus of the MunEDA User Group Meeting 2011 will be the special topic:
Schematic Porting between Different Processes, Assessment & Sizing Flow
Date:
November 24 – 11:00 a.m. to 06:00 p.m.
November 25 – 09:00 a.m. to 06:00 p.m.
Location:
Westin Grand Munich
Arabellastr. 6
81925 Munich, Germany
Selection of Presentation Topics at MUGM 2011:
- SPT Schematic Porting
- Handling Design Contraints & Sizing Rules
- IP Porting & Technology Migration
- Design Performance & Specification Analysis
- Response Surface Modelling & Model Generation
- Circuit Design Optimization & Verification
- Statistical Circuit Analysis & Optimization
- Multi-Testbench Environment & Corner-Based Optimization
- Worst-Case Distance Analysis & Optimization
- Design Shrink & Nano-scale Circuit optimization
- Industrial Design Cases
Thursday, 24th November, 2011
10:00 – 11:00 | Registration & Welcome Coffee |
11:00 – 12:30 | Session 1 |
11:00 – 11:15 | MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA |
11:15 – 11:30 | IPGEN: Introduction – IC Design Acceleration using 1Stone® H. Bothe, IPGEN |
11:30 – 12:00 | STMicroelectronics: Reducing Mismatch Impact by means of Proper Biasing in Fully Differential CMOS Structures A. Capasso, A. Colaci, STMicroelectronics |
12:00 – 12:30 | KEYNOTE: Silicon Saxony – Network Thinking – Growing Together A. Brüning, Chairman Silicon Saxony Workgroup IC Design, ZMDI AG |
12:30 – 14:00 | Lunch Break |
14:00 – 15:30 | Session 2 |
14:00 – 14:30 | What’s new in MunEDA WiCkeD 6.4 (Tool Demonstration) M. Pronath, VP Products & Solutions, MunEDA |
14:30 – 15:00 | STMicroelectronics: AMS Design Flow and Standardization of Analog Design Intents P. Daglio, E. Raciti, STMicroelectronics |
15:00 – 15:30 | Tohoku University: Analog Design Optimization with gm/Id Lookup Table Method and WiCkeD S. Masui, Tohoku University |
15:30 – 16:15 | Coffee & Discussion Break |
16:15 – 18:00 | Session 3 |
16:15 – 16:45 | Toshiba: PLL Loop optimization by WiCkeD M. Kaneko, Toshiba Semiconductor Corporation |
16:45 – 17:15 | SyEnA: Synthesis based design of analog integrated circuits A. Graupner, ZMDI AG |
17:15 – 17:45 | TSMC: TSMC AMS Reference Flow & MunEDA WiCkeD S. Chen, TSMC |
17:45 – 18:00 | Hynix: Analysis Method for The Parasitic RC Variation Problem by WiCkeD S. Lee, Hynix Semiconductor |
18:00- 18:05 | Wrap-up Day 1 and Directions A. Ripp, VP Sales & Marketing, MunEDA |
From 19:30 | Social Event at Altes Hackerhaus |
Friday, 25th November, 2011
09:00 – 10:40 | Session 4 |
09:00 – 09:25 | MunEDA Tools and R&D Roadmap F. Schenkel, VP Research & Development, MunEDA GmbH |
09:25 – 09:50 | STARC: STARCAD AMS Flow – Next Challenges K. Tsuboi, STARC |
09:50 – 10:15 | ON Semiconductor: Methodologies for Mismatch Sizing and Corner Verification for Automotive Applications with WiCkeD (SMAC) J. Daniels, ON Semiconductor |
10:15 – 10:40 | TU-Dresden/Globalfoundries: IP Porting and Resizing for High-Speed NoC D. Walter, S. Höppner, R. Schüffny, Technical University Dresden |
10:40 – 11:15 | Coffee & Discussion Break |
11:15 – 12:30 | Session 5 |
11:15 – 11:40 | MunEDA: SPT Special Session – Schematic Porting (Tool Presentation) M. Pronath, VP Products & Solutions, MunEDA GmbH |
11:40 – 12:00 | MunEDA: SPT Special Session – Schematic Porting (Tool Demonstration) C. Roma, MunEDA GmbH |
12:00 – 12:15 | MunEDA: Trends and Adoption WiCkeD usemodels for Special Tasks G. Strube, MunEDA GmbH |
12:15 – 12:30 | IMMS: Schematic Porting with Symbol Adaption and Initial Sizing as Pre-Process for WiCkeD Optimizations V. Boos, J. Nowak, IMMS GmbH |
12:30 – 14:00 | Lunch Break |
14:00 – 15:40 | Session 6 |
14:00 – 14:25 | Hynix: Design Optimization for Sensing Circuit of Resistive Memory B. Oh, Hynix Semiconductor |
14:25 – 14:50 | Altera: Circuit Optimization with WiCkeD design tools JJ Lew, Altera Corporation |
14:50 – 15:15 | TU-Dresden: Design Flow Integration of the Linearized Operating Point (LOP) Method for Fast Voltage Range Estimation with WiCkeD (SyEnA) S. Höppner, S. Henker, J. Görner, R. Schüffny, Technical University Dresden |
15:15 – 15:40 | STMicroelectronics : Optimization of a 2.133GHz level shifter in 28nm N. Seller, STMicroelectronics |
15:40 – 16:10 | Coffee & Discussion Break |
16:10 – 17:45 | Session 7 |
16:10- 16:35 | Infineon: Parameter Calibration and Cascaded Simulations R. Neubert, P. Rotter, Infineon Technologies |
16:35 – 17:00 | University Rome/STMicroelectronics: Surrogate models for the analog circuit simulation based on a machine learning approach (Manon) A. Ciccazzo, C. Vicari, STMicroelectronics V. Latorre, S. Ludici, Sapienza University of Rome |
17:00 – 17:30 | Survey & Hot Topic Session M. Pronath, VP Products & Solutions, MunEDA GmbH, Germany |
17:30 – 17:45 | Wrap-up & Farewell |
Altes Hackerhaus
Here you will find the password protected MUGM 2011 proceedings:
https://www.muneda.com/mugm/mugm-2011/proceedings/