Overview
We are pleased to invite you to the MunEDA Users Group Meeting 2019.
MUGM 2019 will take place on September 24th (Tue), 2019 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
Date:
September 24 – 09:00 a.m. to 04:00 p.m.
Location:
Maritim Hotel
Goethestraße 7
80336 Munich, Germany
Program
Tuesday, 24th September, 2019
08:30 – 09:00 | Registration & Welcome Coffee |
09:00 – 10:00 | Session 1: Opening & What’s new |
MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA | |
STMicroelectronics – MUGM 2012 Chair Opening Remarks – Pierluigi Daglio P. Daglio, STMicroelectronics – MUGM 2012 Conference Chair | |
MunEDA – What’s new in WiCkeD 7.2 and SPT 2.1 – Integration & R&D Roadmap F. Schenkel, VP Research & Development, MunEDA | |
RWTH Aachen – Circuit Topology Migration of Sigma-Delta ADC (MeKoWA) F. Speicher, RWTH Aachen | |
10:00 – 10:30 | Coffee Break |
10:30 – 12:00 | Session 2: Analog IP Migration |
MunEDA Tutorial – Tools and Methodologies for analog IP Migration between process technologies M. Pronath, MunEDA | |
Fraunhofer – Intelligent IP: Fast Analog IC Design and Migration Using Generators B. Prautsch, Fraunhofer | |
STMicroelectronics – Corner Verification and Design Optimization in Smart Power Technologies P. Daglio, STMicroelectronics | |
ROHM – Effective analog circuit design using optimization tools H. Kojima, ROHM | |
Inplay – Power Optimization for LO Buffers and PA+matching in a low-power SoC R. Mohn, Inplay | |
MUGM Group Picture All Participants | |
12:00 – 13:30 | Lunch Break |
13:30 – 14:30 | Session 3: Circuit Sizing, Robustness, Yield and Reliability Optimization |
MunEDA – Tutorial – New Feature Dependent Simulations for Trimming in WiCkeD7.2 C. Roma, MunEDA | |
CEITEC – Parametric Analysis Optimization MOSFET Macromodels ESD Circuit Simulation R. Dettenborn, CEITEC | |
STMicroelectronics – Circuit Sizing & Robustness Optimization for Automotive Circuits R. Pani, STMicroelectronics | |
Infineon – Migration and Optimization of RF Circuits with WiCkeD S. Kerkmann, Infineon | |
RacyICs – Enabling ULV SoCs through ABBX F. Schraut, RacyICs | |
14:30 – 15:00 | Coffee Break |
15:00 – 16:00 | Session 4: Statistical, Monte-Carlo & High-Sigma Verification |
MunEDA – Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis V. Glöckel, MunEDA | |
IMST – Migration, Sizing, Performance Optimization Flexible Data Converter IPs (MeKoWA) R. Wittmann, IMST | |
STMicroelectronics – 40 nm Read-Path for NVM Analysis and Optimization P. Coppa, STMicroelectronics | |
MunEDA – Wrap-up MUGM 2019 and Preparation for Oktoberfest Social Event A. Ripp, MunEDA | |
From 16:00 | Social Event at Munich Oktoberfest |
Social Event
Munich Oktoberfest – Ochsenbraterei
Proceedings
Here you will find the password protected MUGM 2019 proceedings:
https://www.muneda.com/mugm/mugm-2019/proceedings/