Customer References

STMicroelectronics at MUGM MunEDA User Group Meeting 2023

“MunEDA WiCkeD confirmed as an efficient, complete tool, powerful for optimization.”

Infineon at MUGM MunEDA User Group Meeting 2023

“MunEDA WiCkeD supports us to solve the main challenges in SRAM design like shrinking transistor geometries, process variation, power consumption, density, soft errors”

inPlay at SemiWiki 2023

“I see the MunEDA tools as basically another designer on my team. This is huge since we’re a small team, so the impact has been significant.”
Russell Mohn, Co-Founder and Vice President RF-Design.

RacyICs at MUGM MunEDA User Group Meeting 2023

“WiCkeD binary PASS/FAIL enabled us to use unmodified extracted netlists without need for internal probing or modifications. We derived and verified additional constraints to ensure internal 6-sigma robustness for all flops @ 0.5V and 0.8V”

SONIX at MUGM MunEDA User Group Meeting 2023

“WiCkeD nominal and feasibility optimization tools helped our R&D to fulfill all constraints, performance specifications at same time and even minimized the area of circuits like a bandgap voltage reference in 90nm technology”

IMST at MUGM MunEDA User Group Meeting 2023

“We successfully ported and optimized a 3^rd Order Multibi Sigma Delta ADC from 22nm to 55nm with MunEDA circuit migration and verification tools”

Fraunhofer ENAS at MUGM MunEDA User Group Meeting 2023

“Combining our EDM Simulator with MunEDA’s WiCkeD Tool Suite will allow very fast analysis and optimization of complex Mixed-signal systems”

CTI Renato Archer at MUGM MunEDA User Group Meeting 2023

“With MunEDA WiCkeD we could reduce design time and effort significantly to optimize our control circuits of an LCL for radiation hardening”

STMicroelectronics at MUGM MunEDA User Group Meeting 2023

“WiCkeD-SPT really simplifies the migration configuration. With SPT GUI based tool now the porting process is also accessible to non CAD engineers. It is fast and easy and really user friendly.”

Infineon at MUGM MunEDA User Group Meeting 2023

“MunEDA SPT Schematic Porting Tool is easy to use. We completed already 20 migration projects successfully. Design groups could safe effort of around 10 person months migrating a complex low power RF circuit with over 100 schematics.”

STMicroelectronics at MUGM MunEDA User Group Meeting 2023

“MunEDA WiCkeD is well performing Design Optimizaton on Trimmed Circuits. WiCkeD trimming procedure setup is safe and easy and manages different simulators. Turn-Around Time (TAT) is always analysis-time dependent.”

SONIX at MUGM MunEDA User Group Meeting 2023

“Circuit Verification: WiCkeD GUI of WCO makes it easy to verify the performance and robustness of the circuit. Parameter influence of MCA is helpful for identifying the device that contribute the most to the variance of performance. WiCkeD MCA compute DC operating point for each sample point. It is easy, fast and straightforward to check circuit failures by using sensitivity and further analysis of WiCkeD.”

ROHM at DAC 2019 Las Vegas

“MunEDA WiCkeD is effective to optimize characteristics, area and power-consumption of circuits with shorter design term. WiCkeD has many strengths as follows: excellent optimization algorithms, excellent analysis tools and graphs, useful functions besides optimization, customer friendly support system and onsite training.”

STMicroelectronics at MUGM MunEDA User Group Meeting 2019

“MunEDA WiCkeD tools deliver significant design time reductions with factor of 5-10x less. Simultaneously it improved design efficiency and quality to achieve better circuit performances and robustness. It is fully integrated into STMicroelectronics AMS Design Flow.”

RacyICs at MUGM MunEDA User Group Meeting 2019

“We optimized with MunEDA WiCkeD SRAM and Mixed-Signal IP with GF 22FDX®-Technology under ULV conditions and adaptive bias voltages.”

inPlay at DAC 2019 Las Vegas

“We have used MunEDA’s WiCkeD to optimize RF LO distribution buffers and PA on-chip matching circuits and cut power by 21% while maintaining performance. At worst case we could save 27% on current. Optimization tasks have been reduced from months of designer’s time to only days.”

CEITEC at MUGM MunEDA User Group Meeting 2019

“MunEDA WiCkeD has been successfully used for the development and optimization of MOSFET macromodels for ESD circuit simulation.”

SMIC at SemiWiki Jan 2017

“With MunEDA WiCkeD’s optimization tools we have reduced the power consumption of an ultra low power reference voltage design for IoT applications by phantastic 40% down. We recently finished silicon measurements and could confirm the results from design phase in production.”

Globalfoundries at DATE 2016

“MunEDA’s EDA solutions are proven and qualified fort he design migration & porting into GLOBALFOUNDRIES® technologies.”

CEITEC at MTF MunEDA Technical Forum Brazil 2016

“With WiCkeD trade-off analysis and optimization tools we could reduce the design tuning & sizing time by 75% and ensure the required robustness for all specifications with a critical bandgap design by using MunEDA WiCkeD.”

STMicroelectronics at MUGM MunEDA User Group Meeting 2015

“MunEDA WiCkeD is a substantial part of our reliability-based design flow for our CMOS and FDSOI technologies. WiCkeD enables the designer to consider the performance degradation with high accuracy, efficiency in a fully automated way.”
STMicroelectronics – Reliability-aware design with WiCkeD in ST Technologies

SMIC at MUGM MunEDA User Group Meeting 2015

“We faced large challenges in our latest technologies regarding process drifts and differences between foundries. We required a new method to predict the model parameter variations which can reflect the real silicon performance. For this reason we used WiCkeD’s sensitivity analysis and screening tools to analyse critical model parameters and fit them with deterministic nominal optimization. This delivered definitely a good basis for sizing and design centering for our circuit designers.”

HLMC Shanghai Huali Microelectronics Corporation at MUGM MunEDA User Group Meeting 2014

“With MunEDA tools SPT and DNO we could successfully migrate and optimize for high gain our designs from 55nm to 40nm and simultaneously verify for required PVT corner and statistical variation yield analysis.”

STMicroelectronices at MUGM MunEDA User Group Meeting 2014

“We achieved an area reduction of more than 50% in our I/O Designs by using the automated sizing and optimization tools of MunEDA WiCkeD. We even could improve the design reliability and the accuracy of our CMOS and FDSOI reliability models.”

Altera at MUGM MunEDA User Group Meeting 2014

“After migration to the latest FinFET process node we used MunEDA’s high sigma analysis features to identify in our high performance SRAM memory cells both mismatch and scaled VDD degradation of the read/write stability. Following we have taken advantage of WiCkeD‘s powerful deterministic optimization tools to improve the write signal under consideration of the best area trade-off.”

SMIC at MTF MunEDA Technical Forum Shanghai 2014

“With our WiCkeD-based debug flow we are able to verify feasibility and quality of our designs and list all effective influences with priority.”
SMIC – 40nm 10bit SAR ADC debug and yield optimization using MunEDA WiCkeD

Samsung LSI at MUGM MunEDA User Group Meeting 2013

“We use MunEDA’s tools for design optimization and statistical analysis to optimize various optimized memory interface IP blocks for our new FinFET technology and achieved an average reduction of design turnaround time of 50%, more than 6% performance improvement and up to 15% area reduction.”
Samsung – AutoScript based WiCkeD design optimization flow setup for FinFET high-speed memory interface design

STMicroelectronics at MUGM MunEDA User Group Meeting 2013

“MunEDA WiCkeD is extremely useful for reliability-aware design optimization of standard I/Os to meet tight specifications, ensure good design margins and reduce the design time dramatically.”
STMicroelectronics – Design optimization in deep-submicron technologies covering methodology for reliability based circuit optimization for IOs

SKHynix at MUGM MunEDA User Group Meeting 2012

“MunEDA’s tools are best-in class for interactive and fully automatic yield analysis and optimization in circuit design. As for every semiconductor company, design targets like high performance and yield are number one research goals that imply both profitability and time to market. We added MunEDA’s solutions to Hynix design environment to follow our track in establishing best design methodologies to our design groups and therefore improve quality assurance to our customers.”

Toshiba Corporation at MUGM MunEDA User Group Meeting 2012

“After intensive evaluations, we selected the WiCkeD tool suite to enhance our productivity for analog-mixed-signal design products. Using WiCkeD on different projects, we achieved speed-ups in our circuit analysis, porting and sizing process, reducing the sizing time and effort to deliver quality products for 40nm and below in time.”

Microsemi at MUGM MunEDA User Group Meeting 2012

“The optimization of the SenseAmp for SRAM with WiCkeD took only one day. This is speed-up 5-10X compared to pure manual operation.”
Microsemi – Using WiCkeD for SRAM Sense Amp Optimization

TSMC at MUGM MunEDA User Group Meeting 2011

“We are happy to collaborate with MunEDA, the experts on statistical circuit analysis and specification-driven circuit design automation. WiCkeD delivers a substantial benefit to the designers using TSMC technology.”

Altera at MUGM MunEDA User Group Meeting 2010

“We have been running MunEDA WiCkeD Worst Case Analysis to determine static noise margin at 6.5 sigma and used such cells with mismatch parameters at 6.5 sigma for system-level simulations for our Stratix Products since 40nm.”
Altera – Applications of WiCkeD in FPGA Cell Design

Infineon Technologies at MUGM MunEDA User Group Meeting 2007

“WiCkeD has been seamlessly integrated in the designflow of Infineon for more than a decade. This tool and integration has shown to be very valuable for the designers because it allows them to use a completely GUI-based operation of WiCkeD inside the design framework.”

X-FAB

“Designing mixed-signal ICs is challenging and complex. We are pleased to add MunEDA’s methodologies for circuit performance, statistical analysis and yield optimization to our full statistical modeling support. This powerful software helps our customers make their analog/mixed-signal designs more robust and get to market faster.”

Faraday Technology Corporation

“MunEDA’s WiCkeD showed the capability as an optimization tool in the key role of our IP porting project. The capacity is a general issue for the simulation-based optimization tool. We successfully could demonstrate the circuit optimization process through the comprehensive GUI and script based flow.”

ZMDI

“After testing MunEDA’s design and yield optimization tool WiCkeD in some very successful pilot projects, we chose it for analysis and optimization of analog and mixed-signal circuits and towards increased yield and robustness of our golden IP library.”