muneda.com
Empowering Innovation
 
 
  • Solutions

    • Circuit Migration with SPT 2.0

      Circuit Schematic Migration & IP Porting

      Circuit Sizing for Low Power, Yield & Reliability

      Performance & Corner based Sizing & Tuning Variation, Sigma & Yield based Sizing & Tuning Reliability & Aging based Sizing & Tuning

      Variation Analysis, PVT, Monte Carlo & High-Sigma

      Circuit & Sensitivity Analysis PVT & Corner Analysis Monte Carlo Statistical Analysis 3-5 sigma High Sigma & Worst Case Analysis 6-9 sigma plus Robustness Verification Flow

      Application Cases

      High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation
  • Support

    • Publications & Technical Papers

      Apr 02nd 2018
      SemiWiki - Schematic porting – the key to analog design reuse
       Feb 28th 2018
      MOS-AK 2018 - Advances in Statistical Compact Modelling (MunEDA - Infineon)
       Nov 30th 2017
      SemiWiki - Using Sequential Testing to Shorten Monte Carlo Simulations
      May 31st 2017
      DAC 2017 MunEDA Booth Info Flyer
       Sep 30th 2016
      MunEDA White Paper - High sigma parametric yield estimation for SRAM and Standard Cells
       See more...

      Webinars - On-demand

      See more...

      Webinars - Scheduled

      May 08th 2019
      Webinar (Americas Timezone) Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis       May 08th 2019
      Webinar (Europe Timezones) Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis       May 08th 2019
      Webinar (Asia Timezones) Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis       See more...

      E-Learning

      MunEDA E-Learning Platform Login (for existing MunEDA customers only)




      In case you are a MunEDA customer you can register for an E-Learning account.

      Otherwise please use our Information & Contact Request.
  • Community

    • Customers

      Selection of MunEDA Customers:
      Samsung LSI Altera SKHynix
      SMIC Toshiba Infineon
      See more...

      Partners and Associations

      Selection of MunEDA Partners:
      Synopsys Mentor Graphics Cadence
      TSMC GLOBALFOUNDRIES STMicroelectronics
      See more...

      MunEDA User Group Meetings

      Sep 24th 2019
      MUGM MunEDA User Group Meeting 2019 - Munich, Germany       Nov 07th 2017
      MUGM MunEDA User Group Meeting 2017 - Munich, Germany       Mar 03rd 2016
      MTF MunEDA Technical Forum Brazil 2016 - Trindade, Brazil       Oct 27th 2015
      MUGM MunEDA User Group Meeting 2015 - Munich, Germany       Apr 16th 2015
      MTF MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan       See more...

      MunEDA University Program

      Selection of Members:
      Technical University of Munich Chair of Electronic Design Automation Chair of Technical Electronics
      Goethe University Frankfurt Institute of Microelectronic Systems Ulm - University of Applied Sciences
      See more...
  • Company

    • News

      Feb 01st 2019
      See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe       Jan 30th 2019
      IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA       Jan 22nd 2019
      MunEDA Gold Sponsor at 24th ASP-DAC 24th Asia and South Pacific Design Automation Conference 2019       Jun 28th 2018
      EDACafe - DAC2018 EDACafe-MunEDA Video Interview - Sanjay Gangal with Michael Pronath       Jun 27th 2018
      DAC 2018 - MunEDA presents New SPT Schematic Porting Tool 2.0 and new WiCkeD Design & Sizing Suite 7.1       See more...

      Events

      Jun 03rd 2019
      DAC 2019 Tutorial - Analog IP Migration and Verification - STMicroelectronics, ROHM, inPlay, Fraunhofer, MunEDA - Las Vegas, USA       May 08th 2019
      MunEDA Webinars 18May - Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis - Americas, Europe, Asia, Timezones       Oct 29th 2018
      Meet MunEDA @ Huada Empyrean User Group Meeting Oct 29, Nanjing, China - Nanjing, China       Sep 13th 2018
      Analog 2018 - Munich, Germany       Jun 25th 2018
      DAC 2018 - San Francisco - San Francisco, USA       See more...

      Company

      Information & Contact Request Contacts & Distributors About Us Management Advisory Board Directions Careers

      Corporate Headquarter

      MunEDA GmbH
      MunEDA GmbH
      Inselkammerstraße 5
      82008 Unterhaching, Germany

      fon: +49-89-622710-20
      fax: +49-89-622710-299
      email: info@muneda.com
      web: www.muneda.com
      map: Google-Maps
 
  • Solutions
    Circuit Migration | Sizing & Tuning | Analysis | Applications
  • Support
    Publications | Webinars | E-Learning | Info & Contact
  • Community
    Customers | Partners | MUGM | Universities
  • Company
    Distributors | About | Management | Advisory | Directions | Careers
 
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit
Migration
Circuit
Sizing
Circuit
Verification
MunEDA provides within it's WiCkeDTM suite EDA tools for migration, sizing and verification of Custom IC circuits such as Highspeed I/O, Memory, RF Circuits, Analog, Standard Cells, and many others.

Designers can improve and optimize the circuit regarding contraints & feasibility, performances & specifications, robustness, yield, area, stability, timing, power, realiability, aging, degradation, stress, self heating and many others. Learn more
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit Schematic Migration & IP Porting
Circuit Migration with SPT 2.0 MunEDA Schematic Porting Tool for circuit schematic migration and IP porting between different process technologies Learn more
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit Sizing for Low Power, Yield & Reliability
Circuit Sizing with WiCkeDTM Meet performance specifications over all types of variation, design and operation parameters with MunEDA machine learning sizing & optimization tools Learn more
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit Verification for Variation, PVT, Monte Carlo & High-Sigma
Circuit Verification with WiCkeDTM Analyze and verify your circuit designs for constraints, performance specifications, operating and process parameters, global and mismatch variation, reliability and others Learn more
 
 
Circuit Schematic Migration & IP Porting
Learn more...
Variation Analysis, PVT, Monte Carlo & High-Sigma
Learn more...
Circuit Sizing for Low Power, Yield & Reliability
Learn more...
  • Latest
  • News
  • Events
  • Webinars
  • Papers
  • MUGM
Jun
03rd
2019
DAC 2019 Tutorial - Analog IP Migration and Verification - STMicroelectronics, ROHM, inPlay, Fraunhofer, MunEDA - Las Vegas, USA:
May
08th
2019
MunEDA Webinars 18May - Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis - Americas, Europe, Asia, Timezones: Join!
Feb
01st
2019
See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe
Jan
30th
2019
IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA
Apr
02nd
2018
SemiWiki - Schematic porting – the key to analog design reuse
Feb
01st
2019
See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe
Jan
30th
2019
IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA
Jan
22nd
2019
MunEDA Gold Sponsor at 24th ASP-DAC 24th Asia and South Pacific Design Automation Conference 2019
Jun
28th
2018
EDACafe - DAC2018 EDACafe-MunEDA Video Interview - Sanjay Gangal with Michael Pronath
Jun
27th
2018
DAC 2018 - MunEDA presents New SPT Schematic Porting Tool 2.0 and new WiCkeD Design & Sizing Suite 7.1

See more...
Jun
03rd
2019
DAC 2019 Tutorial - Analog IP Migration and Verification - STMicroelectronics, ROHM, inPlay, Fraunhofer, MunEDA - Las Vegas, USA:
May
08th
2019
MunEDA Webinars 18May - Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis - Americas, Europe, Asia, Timezones: Join!
Oct
29th
2018
Meet MunEDA @ Huada Empyrean User Group Meeting Oct 29, Nanjing, China - Nanjing, China:
Sep
13th
2018
Analog 2018 - Munich, Germany: Visit MunEDA Tutorial and Exhibition Booth at Analog 2018
Jun
25th
2018
DAC 2018 - San Francisco - San Francisco, USA: Visit MunEDA booth #1463 at DAC 2018 in San Francisco

See more...
Scheduled
May
08th
2019
Webinar (Americas Timezone) Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis
May
08th
2019
Webinar (Europe Timezones) Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis
May
08th
2019
Webinar (Asia Timezones) Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis

See more...
Apr
02nd
2018
SemiWiki - Schematic porting – the key to analog design reuse
Feb
28th
2018
MOS-AK 2018 - Advances in Statistical Compact Modelling (MunEDA - Infineon)
Nov
30th
2017
SemiWiki - Using Sequential Testing to Shorten Monte Carlo Simulations
May
31st
2017
DAC 2017 MunEDA Booth Info Flyer
Sep
30th
2016
MunEDA White Paper - High sigma parametric yield estimation for SRAM and Standard Cells

See more...
Sep
24th
2019
MUGM MunEDA User Group Meeting 2019 - Munich, Germany
Nov
07th
2017
MUGM MunEDA User Group Meeting 2017 - Munich, Germany
Mar
03rd
2016
MTF MunEDA Technical Forum Brazil 2016 - Trindade, Brazil
Oct
27th
2015
MUGM MunEDA User Group Meeting 2015 - Munich, Germany
Apr
16th
2015
MTF MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan

See more...
Application Cases
High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation
 
 
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