muneda.com
Empowering Innovation
 
 
  • Solutions

    • Circuit Schematic Migration & IP Porting

      Variation Analysis, PVT, Monte Carlo & High-Sigma

      Circuit & Sensitivity Analysis PVT & Corner Analysis Monte Carlo Statistical Analysis 3-5 sigma High Sigma & Worst Case Analysis 6-9 sigma plus Robustness Verification Flow

      Circuit Sizing for Low Power, Yield & Reliability

      Performance & Corner based Sizing & Tuning Variation, Sigma & Yield based Sizing & Tuning Reliability & Aging based Sizing & Tuning

      Application Cases

      High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation
  • Support

    • Publications & Technical Papers

      May 31st 2017
      DAC 2017 MunEDA Booth Info Flyer
       Sep 30th 2016
      MunEDA White Paper - High sigma parametric yield estimation for SRAM and Standard Cells
       Aug 03rd 2016
      Yield-driven Power-Delay-Optimal CMOS full-adder design PVT NBTI (Sapienza, MunEDA)
       Mar 31st 2016
      IRPS 2016 - BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization - (STMicroelectronics-MunEDA)
       Aug 31st 2015
      New Technology Migration Methodology for Analog IC Design (using MunEDA SPT Schematic Porting Tool)
       See more...

      Webinars

      Jun 01st 2017
      Low Power Circuit Sizing for IoT       Apr 04th 2017
      MunEDA Webinar - Low Power Circuit Optimization for IoT       Mar 24th 2017
      MunEDA Webinar on High Sigma Variation Analysis for Memories       Aug 30th 2016
      Analog Design Migration       Sep 09th 2015
      SRAM parametric yield analysis       See more...

      E-Learning

      You have to login to use MunEDA E-Learning Platform.




      If you don't have an account, please register for E-Learning.

      MunEDA & Distributor-Net

      MunEDA WebEx

  • Community

    • Customers

      Selection of MunEDA Customers:
      Samsung LSI Altera SKHynix
      SMIC Toshiba Infineon
      See more...

      Partners and Associations

      Selection of MunEDA Partners:
      Synopsys Mentor Graphics Cadence
      TSMC GLOBALFOUNDRIES STMicroelectronics
      See more...

      MunEDA User Group Meetings

      Nov 07th 2017
      MunEDA User Group Meeting Europe 2017 - Munich, Germany       Mar 03rd 2016
      MunEDA Technical Forum Brazil 2016 - Trindade, Brazil       Oct 27th 2015
      MunEDA User Group Meeting Europe 2015 - Munich, Germany       Apr 16th 2015
      MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan       Mar 04th 2015
      MunEDA Technical Forum Korea 2015 - Seoul, Korea       See more...

      MunEDA University Program

      Selection of Members:
      Technical University of Munich Chair of Electronic Design Automation Chair of Technical Electronics
      Goethe University Frankfurt Institute of Microelectronic Systems Ulm - University of Applied Sciences
      See more...
  • Company

    • News

      Jun 19th 2017
      Visit MunEDA Booth @ DAC Design Automation Conference Austin TX - June 19-21, 2017       Jun 01st 2017
      MunEDA Webinar - Low Power Circuit Sizing for IoT       Apr 04th 2017
      MunEDA-EDADirect Webinar on Low Power Circuit Optimization for IoT - Register now !       Mar 24th 2017
      MunEDA Webinar on High Sigma Variation Analysis for Memories       Jan 11th 2017
      SemiWiki - Analog, Low-power Optimization at SMIC       See more...

      Events

      Nov 07th 2017
      MUGM 2017 - MunEDA User Group Meeting - Munich, Germany       Jun 19th 2017
      Visit MunEDA Booth #1012 @ DAC 2017 - Mon-Wed June 19-21 - Austin, USA       Mar 27th 2017
      Meet MunEDA @ DATE 2017 - Mar28-30 - Lausanne, Switzerland       Feb 02nd 2017
      HSPICE SIG - Santa Clara, USA       Nov 23rd 2016
      European Nanoelectronics Forum 2016 - Rome, Italy       See more...

      Company

      Contacts & Distributors About Us Management Advisory Board Directions Careers

      Corporate Headquarter

      MunEDA GmbH
      MunEDA GmbH
      Stefan-George-Ring 29
      81929 Munich, Germany

      fon: +49-89-93086-330
      fax: +49-89-93086-407
      email: info@muneda.com
      web: www.muneda.com
      map: Google-Maps
 
  • Solutions
    Circuit Migration | Analysis | Sizing & Tuning | Applications
  • Support
    Publications | Webinars | E-Learning | Distributor-Net | MunEDA WebEx
  • Community
    Customers | Partners | MUGM User Group | Uni-Program
  • Company
    Contacts | About Us | Management | Advisory Board | Directions | Careers
 
EDA Tools for Design Migration, Analysis & Verification, Tuning & Sizing of Custom IC Design
Jun 19th 2017
Visit MunEDA Booth #1012 @ DAC 2017 - Mon-Wed June 19-21 - Austin, USA
Download MunEDA Paper - Sep 2016, Munich, Germany
MunEDA White Paper - High sigma parametric yield estimation f...
Join MunEDA User Group Meeting Europe 2017
from Nov 07 to Nov 08 in Munich
 
 
Circuit Schematic Migration & IP Porting
Learn more...
Variation Analysis, PVT, Monte Carlo & High-Sigma
Learn more...
Circuit Sizing for Low Power, Yield & Reliability
Learn more...
  • Latest
  • News
  • Events
  • Webinars
  • Papers
  • User Group Meetings
Jun
19th
2017
Visit MunEDA Booth @ DAC Design Automation Conference Austin TX - June 19-21, 2017
Jun
01st
2017
MunEDA Webinar - Low Power Circuit Sizing for IoT
Mar
24th
2017
MunEDA Webinar on High Sigma Variation Analysis for Memories
Jan
11th
2017
SemiWiki - Analog, Low-power Optimization at SMIC
Aug
31st
2016
SemiWiki - Three Steps for Custom IC Design Migration and Optimization
May
16th
2016
SemiWiki - SRAM Optimization for 14nm and 28nm FDSOI with MunEDA WiCkeD
Nov
07th
2017
MUGM 2017 - MunEDA User Group Meeting - Munich, Germany: Join the MunEDA User Community Event
Jun
19th
2017
Visit MunEDA Booth #1012 @ DAC 2017 - Mon-Wed June 19-21 - Austin, USA:
Jun
01st
2017
Low Power Circuit Sizing for IoT - Audience: Circuit Designer, Design Manager, CAD Engineers, EDA Manager
Nov
07th
2017
MunEDA User Group Meeting Europe 2017 - Munich, Germany
Mar
03rd
2016
MunEDA Technical Forum Brazil 2016 - Trindade, Brazil
Oct
27th
2015
MunEDA User Group Meeting Europe 2015 - Munich, Germany
Jun
19th
2017
Visit MunEDA Booth @ DAC Design Automation Conference Austin TX - June 19-21, 2017
Jun
01st
2017
MunEDA Webinar - Low Power Circuit Sizing for IoT
Apr
04th
2017
MunEDA-EDADirect Webinar on Low Power Circuit Optimization for IoT - Register now !
Mar
24th
2017
MunEDA Webinar on High Sigma Variation Analysis for Memories
Jan
11th
2017
SemiWiki - Analog, Low-power Optimization at SMIC

See more...
Nov
07th
2017
MUGM 2017 - MunEDA User Group Meeting - Munich, Germany: Join the MunEDA User Community Event
Jun
19th
2017
Visit MunEDA Booth #1012 @ DAC 2017 - Mon-Wed June 19-21 - Austin, USA:
Mar
27th
2017
Meet MunEDA @ DATE 2017 - Mar28-30 - Lausanne, Switzerland: Design Automation & Test in Europe Conference & Exhibition
Feb
02nd
2017
HSPICE SIG - Santa Clara, USA: Visit MunEDA Booth @ HSPICE SIG 2017 in Santa Clara
Nov
23rd
2016
European Nanoelectronics Forum 2016 - Rome, Italy: Meet MunEDA @ European Nanoelectronics Forum 2016

See more...
Jun
01st
2017
Low Power Circuit Sizing for IoT - Audience: Circuit Designer, Design Manager, CAD Engineers, EDA Manager
Apr
04th
2017
MunEDA Webinar - Low Power Circuit Optimization for IoT - Audience: Analog and memory circuit designers, design managers, CAD engineers, CAD managers
Mar
24th
2017
MunEDA Webinar on High Sigma Variation Analysis for Memories - Audience: Analog and memory circuit designers, design managers, CAD engineers, CAD managers
Aug
30th
2016
Analog Design Migration - Audience: Analog designers, design managers, CAD engineers and CAD managers
Sep
09th
2015
SRAM parametric yield analysis - Audience: SRAM circuit designers, design managers, CAD engineers, CAD managers

See more...
May
31st
2017
DAC 2017 MunEDA Booth Info Flyer
Sep
30th
2016
MunEDA White Paper - High sigma parametric yield estimation for SRAM and Standard Cells
Aug
03rd
2016
Yield-driven Power-Delay-Optimal CMOS full-adder design PVT NBTI (Sapienza, MunEDA)
Mar
31st
2016
IRPS 2016 - BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization - (STMicroelectronics-MunEDA)
Aug
31st
2015
New Technology Migration Methodology for Analog IC Design (using MunEDA SPT Schematic Porting Tool)

See more...
Nov
07th
2017
MunEDA User Group Meeting Europe 2017 - Munich, Germany
Mar
03rd
2016
MunEDA Technical Forum Brazil 2016 - Trindade, Brazil
Oct
27th
2015
MunEDA User Group Meeting Europe 2015 - Munich, Germany
Apr
16th
2015
MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan
Mar
04th
2015
MunEDA Technical Forum Korea 2015 - Seoul, Korea

See more...
Application Cases
High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation
 
 
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