muneda.com
Empowering Innovation
 
 
  • Solutions

    • Circuit Migration with SPT 2.0

      Circuit Schematic Migration & IP Porting

      Circuit Sizing for Low Power, Yield & Reliability

      Performance & Corner based Sizing & Tuning Variation, Sigma & Yield based Sizing & Tuning Reliability & Aging based Sizing & Tuning

      Variation Analysis, PVT, Monte Carlo & High-Sigma

      Circuit & Sensitivity Analysis PVT & Corner Analysis Monte Carlo Statistical Analysis 3-5 sigma High Sigma & Worst Case Analysis 6-9 sigma plus Robustness Verification Flow

      Application Cases

      High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation
  • Support

    • Publications & Technical Papers

      May 31st 2019
      Analog IP Migration and Verification - DAC 2019 Las Vegas Tutorial
       Apr 02nd 2018
      SemiWiki - Schematic porting – the key to analog design reuse
       Feb 28th 2018
      MOS-AK 2018 - Advances in Statistical Compact Modelling (MunEDA - Infineon)
       Nov 30th 2017
      SemiWiki - Using Sequential Testing to Shorten Monte Carlo Simulations
      May 31st 2017
      DAC 2017 MunEDA Booth Info Flyer
       See more...

      Webinars - On-demand

      VOD
      Analog IP Migration, Optimization and Verification (Japanese subtitles)       VOD
      Analog IP Migration, Optimization and Verification       See more...

      Webinars - Scheduled

      See more...

      E-Learning

      MunEDA E-Learning Platform Login (for existing MunEDA customers only)




      In case you are a MunEDA customer you can register for an E-Learning account.

      Otherwise please use our Information & Contact Request.
  • Community

    • Customers

      Selection of MunEDA Customers:
      Samsung LSI Altera SKHynix
      SMIC Toshiba Infineon
      See more...

      Partners and Associations

      Selection of MunEDA Partners:
      Synopsys Samsung Cadence
      TSMC GLOBALFOUNDRIES STMicroelectronics
      See more...

      MunEDA User Group Meetings

      Sep 24th 2019
      MUGM MunEDA User Group Meeting 2019 - Munich, Germany       Nov 07th 2017
      MUGM MunEDA User Group Meeting 2017 - Munich, Germany       Mar 03rd 2016
      MTF MunEDA Technical Forum Brazil 2016 - Trindade, Brazil       Oct 27th 2015
      MUGM MunEDA User Group Meeting 2015 - Munich, Germany       Apr 16th 2015
      MTF MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan       See more...

      MunEDA University Program

      Selection of Members:
      Technical University of Munich Chair of Electronic Design Automation Chair of Technical Electronics
      Goethe University Frankfurt Institute of Microelectronic Systems Ulm - University of Applied Sciences
      See more...
  • Company

    • News

      Jul 31st 2019
      SemiWiki - 56th DAC – In Depth Look at Analog IP Migration from MunEDA       Jul 17th 2019
      Visit GTI Forum Taiwan - MunEDA Presentation & Exhibition       Jun 03rd 2019
      SemiWiki - Ceitec / MunEDA: A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation       Feb 01st 2019
      See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe       Jan 30th 2019
      IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA       See more...

      Events

      Jun 30th 2020
      Webinar: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis - ,       Jun 25th 2019
      IEEE NEWCAS 2019 - Munich, Germany       Jun 03rd 2019
      DAC 2019 Tutorial - Las Vegas, USA       May 08th 2019
      MunEDA Webinars May 8th - Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis - Americas, Europe, Asia, Timezones       Oct 29th 2018
      Meet MunEDA @ Huada Empyrean User Group Meeting Oct 29, Nanjing, China - Nanjing, China       See more...

      Company

      Information & Contact Request Contacts & Distributors About Us Management Advisory Board Directions Careers

      Corporate Headquarter

      MunEDA GmbH
      MunEDA GmbH
      Inselkammerstraße 5
      82008 Unterhaching, Germany

      fon: +49-89-622710-20
      fax: +49-89-622710-299
      email: info@muneda.com
      web: www.muneda.com
      map: Google-Maps
 
  • Solutions
    Circuit Migration | Sizing & Tuning | Analysis | Applications
  • Support
    Publications | Webinars | E-Learning | Info & Contact
  • Community
    Customers | Partners | MUGM | Universities
  • Company
    Distributors | About | Management | Advisory | Directions | Careers
 
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit
Migration
Circuit
Sizing
Circuit
Verification
MunEDA provides within it's WiCkeDTM suite EDA tools for migration, sizing and verification of Custom IC circuits such as Highspeed I/O, Memory, RF Circuits, Analog, Standard Cells, and many others.

Designers can improve and optimize the circuit regarding contraints & feasibility, performances & specifications, robustness, yield, area, stability, timing, power, realiability, aging, degradation, stress, self heating and many others. Learn more
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit Schematic Migration & IP Porting
Circuit Migration with SPT 2.0 MunEDA Schematic Porting Tool for circuit schematic migration and IP porting between different process technologies Learn more
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit Sizing for Low Power, Yield & Reliability
Circuit Sizing with WiCkeDTM Meet performance specifications over all types of variation, design and operation parameters with MunEDA machine learning sizing & optimization tools Learn more
MunEDA EDA Tools for migration, sizing and verification of Custom IC
Circuit Verification for Variation, PVT, Monte Carlo & High-Sigma
Circuit Verification with WiCkeDTM Analyze and verify your circuit designs for constraints, performance specifications, operating and process parameters, global and mismatch variation, reliability and others Learn more
 
 
Circuit Schematic Migration & IP Porting
Learn more...
Variation Analysis, PVT, Monte Carlo & High-Sigma
Learn more...
Circuit Sizing for Low Power, Yield & Reliability
Learn more...
  • Latest
  • News
  • Events
  • Webinars
  • Papers
  • MUGM
Jun
30th
2020
Webinar: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis - , :
Sep
24th
2019
MUGM MunEDA User Group Meeting 2019 - Munich, Germany
Jul
31st
2019
SemiWiki - 56th DAC – In Depth Look at Analog IP Migration from MunEDA
Jul
17th
2019
Visit GTI Forum Taiwan - MunEDA Presentation & Exhibition
Jun
03rd
2019
SemiWiki - Ceitec / MunEDA: A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation
May
31st
2019
Analog IP Migration and Verification - DAC 2019 Las Vegas Tutorial
Feb
01st
2019
See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe
Jan
30th
2019
IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA
Jul
31st
2019
SemiWiki - 56th DAC – In Depth Look at Analog IP Migration from MunEDA
Jul
17th
2019
Visit GTI Forum Taiwan - MunEDA Presentation & Exhibition
Jun
03rd
2019
SemiWiki - Ceitec / MunEDA: A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation
Feb
01st
2019
See MunEDA contribution in NEREID NanoElectronics Roadmap for Europe
Jan
30th
2019
IMST, RWTH Aachen, Dikuli and MunEDA collaborate in BMBF-Funded Project MeKoWA

See more...
Jun
30th
2020
Webinar: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis - , :
Jun
25th
2019
IEEE NEWCAS 2019 - Munich, Germany: Invited talk in special session B3L-B about analog circuit verification with corners, Monte Carlo, machine learning, worst-case analysis,..
Jun
03rd
2019
DAC 2019 Tutorial - Las Vegas, USA: Analog IP Migration and Verification - STMicroelectronics, ROHM, inPlay, Fraunhofer, MunEDA
May
08th
2019
MunEDA Webinars May 8th - Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis - Americas, Europe, Asia, Timezones: Join!
Oct
29th
2018
Meet MunEDA @ Huada Empyrean User Group Meeting Oct 29, Nanjing, China - Nanjing, China:

See more...
On-demand
 
VOD
 
Analog IP Migration, Optimization and Verification (Japanese subtitles)
 
VOD
 
Analog IP Migration, Optimization and Verification

See more...
May
31st
2019
Analog IP Migration and Verification - DAC 2019 Las Vegas Tutorial
Apr
02nd
2018
SemiWiki - Schematic porting – the key to analog design reuse
Feb
28th
2018
MOS-AK 2018 - Advances in Statistical Compact Modelling (MunEDA - Infineon)
Nov
30th
2017
SemiWiki - Using Sequential Testing to Shorten Monte Carlo Simulations
May
31st
2017
DAC 2017 MunEDA Booth Info Flyer

See more...
Sep
24th
2019
MUGM MunEDA User Group Meeting 2019 - Munich, Germany
Nov
07th
2017
MUGM MunEDA User Group Meeting 2017 - Munich, Germany
Mar
03rd
2016
MTF MunEDA Technical Forum Brazil 2016 - Trindade, Brazil
Oct
27th
2015
MUGM MunEDA User Group Meeting 2015 - Munich, Germany
Apr
16th
2015
MTF MunEDA Technical Forum Taiwan 2015 - Hsinchu, Taiwan

See more...
Application Cases
High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA) Low Power Tuning & Sizing for Custom Circuits Standard Cell & I/O Custom Cell Design Sizing & Performance Optimization RSM Circuit Modelling & Model Generation Model Characterization & Process Model Backward Propagation

Handflyer: Product Overview (Japanese Version)
 
 
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